Inventor · disambiguated record

Bernard Matt

Also filed as: MATT BERNARD

1 granted patent·19 citations·filing 2000–2000

39Inventor score

Technology areasH10P

Files withADVANCED MICRO DEVICES INC1

Top patents by PatentIndex Score

1 record

0168US6320402B1Parallel inspection of semiconductor wafers by a plurality of different inspection stations to maximize throughputADVANCED MICRO DEVICES INC·Filed 2000·Granted Nov 20, 2001·19 cites·20 claims

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Bernard Matt — Patent Inventor | PatentIndex