Inventor · disambiguated record
Benno Orschel
Also filed as: ORSCHEL BENNO
16 granted patents·3 pending applications·28 citations·filing 1999–2024
88Inventor score
Files withORSCHEL BENNO6SUNEDISON SEMICONDUCTOR LTD UEN201334164H5GLOBALWAFERS CO LTD3AOTI OPERATING CO INC1SUMCO CORP1
Top patents by PatentIndex Score
19 records- 0173US8496765B2Method for correcting speed deviations between actual and nominal pull speed during crystal growthORSCHEL BENNO·Filed 2009·Granted Jul 30, 2013·2 cites·6 claims
- 0264US9330014B2Method and system for full resolution real-time data loggingSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2013·Granted May 3, 2016·2 cites·18 claims
- 0362US8673075B2Procedure for in-situ determination of thermal gradients at the crystal growth frontORSCHEL BENNO·Filed 2012·Granted Mar 18, 2014·0 cites·19 claims
- 0460US10030964B2Systems and methods for performing phase shift interferometry while a wafer is vibratingSUNEDISON SEMICONDUCTOR LTD·Filed 2015·Granted Jul 24, 2018·1 cites·20 claims
- 0560US10007255B2Systems and methods for controlling temperatures in an epitaxial reactorSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2014·Granted Jun 26, 2018·1 cites·20 claims
- 0660US2024401930A1Full wafer thickness map reflectometryGLOBALWAFERS CO LTD·Filed 2024·Application pending·0 cites
- 0759US8221545B2Procedure for in-situ determination of thermal gradients at the crystal growth frontORSCHEL BENNO·Filed 2008·Granted Jul 17, 2012·0 cites·10 claims
- 0858US8641822B2Method and apparatus for controlling diameter of a silicon crystal ingot in a growth processORSCHEL BENNO·Filed 2010·Granted Feb 4, 2014·0 cites·12 claims
- 0955US2025157847A1Systems and methods for bond treating and cleaving of silicon wafersGLOBALWAFERS CO LTD·Filed 2023·Application pending·0 cites
- 1054US7521954B2Method for determining a minority carrier diffusion length using surface photo voltage measurementsSUMCO CORP·Filed 2006·Granted Apr 21, 2009·2 cites·20 claims
- 1152US6526372B1Method and device for determining the dependence of a first measuring quantity on a second measuring quantityAOTI OPERATING CO INC·Filed 1999·Granted Feb 25, 2003·20 cites·16 claims
- 1250US10361106B2Methods and systems for preventing unsafe operationsGLOBALWAFERS CO LTD·Filed 2018·Granted Jul 23, 2019·0 cites·17 claims
- 1349US10032659B2Methods and systems for preventing unsafe operationsSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2013·Granted Jul 24, 2018·0 cites·20 claims
- 1449US9459935B2Methods and systems for deterministic and multithreaded script objects and script engineSUNEDISON INC·Filed 2013·Granted Oct 4, 2016·0 cites·20 claims
- 1547US2010024717A1Reversed action diameter control in a semiconductor crystal growth systemORSCHEL BENNO·Filed 2008·Application pending·0 cites
- 1646US9727045B2Method and system for a meta-recipe control software architectureSUNEDISON SEMICONDUCTOR LTD (UEN201334164H)·Filed 2013·Granted Aug 8, 2017·0 cites·17 claims
- 1746US8012255B2Method and apparatus for controlling diameter of a silicon crystal ingot in a growth processSUMCO PHOENIX CORP·Filed 2008·Granted Sep 6, 2011·0 cites·14 claims
- 1844US9384540B2Systems and methods for interferometric phase measurementSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2013·Granted Jul 5, 2016·0 cites·20 claims
- 1943US8545623B2Method and apparatus for controlling the growth process of a monocrystalline silicon ingotORSCHEL BENNO·Filed 2009·Granted Oct 1, 2013·0 cites·15 claims
Join the waitlist — get patent alerts
Get an alert when Benno Orschel files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →