Inventor · disambiguated record
Benjamin Shieh
Also filed as: SHIEH BENJAMIN · SHIEH BENJAMIN P
2 granted patents·311 citations·filing 1998–2008
68Inventor score
Technology areasH10P
Top patents by PatentIndex Score
2 records- 0194US6204200B1Process scheme to form controlled airgaps between interconnect lines to reduce capacitanceTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 20, 2001·304 cites·17 claims
- 0273US7932105B1Systems and methods for detecting and monitoring nickel-silicide process and induced failuresPDF SOLUTIONS·Filed 2008·Granted Apr 26, 2011·7 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →