Inventor · disambiguated record
Bernd Srocka
Also filed as: SROCKA BERND
13 granted patents·1 pending application·42 citations·filing 1999–2020
87Inventor score
Files withHSEB DRESDEN GMBH7SENTRONICS METROLOGY GMBH2SROCKA BERND2ACCENT OPTICAL TECHNOLOGIES NA1AOTI OPERATING CO INC1
Top patents by PatentIndex Score
14 records- 0181US9587930B2Method and assembly for determining the thickness of a layer in a sample stackHSEB DRESDEN GMBH·Filed 2016·Granted Mar 7, 2017·4 cites·13 claims
- 0280US9646372B2Inspection apparatusHSEB DRESDEN GMBH·Filed 2013·Granted May 9, 2017·4 cites·18 claims
- 0375US8837807B2Inspection method with color correctionSROCKA BERND·Filed 2011·Granted Sep 16, 2014·4 cites·12 claims
- 0461US9217633B2Inspection arrangementHSEB DRESDEN GMBH·Filed 2013·Granted Dec 22, 2015·1 cites·12 claims
- 0554US8817089B2Inspection systemSROCKA BERND·Filed 2010·Granted Aug 26, 2014·1 cites·19 claims
- 0652US6526372B1Method and device for determining the dependence of a first measuring quantity on a second measuring quantityAOTI OPERATING CO INC·Filed 1999·Granted Feb 25, 2003·20 cites·16 claims
- 0751US7265571B2Method and device for determining a characteristic of a semiconductor sampleACCENT OPTICAL TECHNOLOGIES NA·Filed 2004·Granted Sep 4, 2007·8 cites·6 claims
- 0848US12025424B2Device and method for measuring height profiles on an objectSENTRONICS METROLOGY GMBH·Filed 2020·Granted Jul 2, 2024·0 cites·17 claims
- 0948US9176070B2Inspection assemblyHSEB DRESDEN GMBH·Filed 2014·Granted Nov 3, 2015·0 cites·13 claims
- 1046US9500582B2Method for detecting buried layersHSEB DRESDEN GMBH·Filed 2014·Granted Nov 22, 2016·0 cites·12 claims
- 1142US12235209B2Device and method for measuring the profile of flat objects comprising unknown materialsSENTRONICS METROLOGY GMBH·Filed 2020·Granted Feb 25, 2025·0 cites·18 claims
- 1236US9671602B2Measurement method for height profiles of surfaces using a differential interference contrast imageSCHMIDT CHRISTINE·Filed 2012·Granted Jun 6, 2017·0 cites·12 claims
- 1335US10132612B2Method and assembly for determining the thickness of a layer in a sample stackHSEB DRESDEN GMBH·Filed 2017·Granted Nov 20, 2018·0 cites·15 claims
- 1433US2015036915A1Inspection MethodHSEB DRESDEN GMBH·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →