Inventor · disambiguated record
Bii-Junq Chang
Also filed as: CHANG BII-JUNQ
12 granted patents·1 pending application·261 citations·filing 1996–2010
92Inventor score
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13 records- 0193US6395576B1High efficiency color filter process to improve color balance in semiconductor array imaging devicesTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted May 28, 2002·89 cites·16 claims
- 0290US7264976B2Advance ridge structure for microlens gapless approachTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Sep 4, 2007·19 cites·3 claims
- 0388US6582988B1Method for forming micro lens structuresTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Jun 24, 2003·48 cites·15 claims
- 0482US7505206B2Microlens structure for improved CMOS image sensor sensitivityTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Mar 17, 2009·14 cites·10 claims
- 0582US6531266B1Rework procedure for the microlens element of a CMOS image sensorTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Mar 11, 2003·32 cites·16 claims
- 0674US7507598B2Image sensor fabrication method and structureTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Mar 24, 2009·6 cites·12 claims
- 0765US7704778B2Microlens structure for image sensorsTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Apr 27, 2010·1 cites·22 claims
- 0861US5951743AMethod and apparatus for feeding exhaust gases to a wet scrubberTAIWAN SEMICONDUCTOR MFG·Filed 1997·Granted Sep 14, 1999·29 cites·17 claims
- 0954US2010164040A1Microlens Structure for Image SensorsTAIWAN SEMICONDUCTOR MFG·Filed 2010·Application pending·0 cites
- 1051US8129762B2Image sensorWENG FU-TIEN·Filed 2008·Granted Mar 6, 2012·0 cites·21 claims
- 1149US6511779B1Method for fabricating high resolution color filter image array optoelectronic microelectronic fabricationTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Jan 28, 2003·5 cites·17 claims
- 1243US5765501AMarker for scale of an indicatorTAIWAN SEMICONDUCTOR MFG·Filed 1996·Granted Jun 16, 1998·15 cites·12 claims
- 1333US6017393APhotoresist supply system with air ventingTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Jan 25, 2000·3 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →