Inventor · disambiguated record
Bin Gong
Also filed as: GONG BIN
4 granted patents·8 pending applications·18 citations·filing 2009–2023
71Inventor score
Top patents by PatentIndex Score
12 records- 0182US8548866B2Methods and systems to supplement a listing via a third party trust providerVARADARAJAN DILIP·Filed 2012·Granted Oct 1, 2013·7 cites·23 claims
- 0280US8200543B2Methods and systems to supplement a listing via a third party trust providerVARADARAJAN DILIP·Filed 2010·Granted Jun 12, 2012·6 cites·19 claims
- 0364US8109486B2Chassis with rubber padsGONG BIN·Filed 2009·Granted Feb 7, 2012·5 cites·5 claims
- 0461US2014032365A1Methods and systems to supplement a listing via a third party trust providerEBAY INC·Filed 2013·Application pending·0 cites
- 0546US2014348853A1Methods of treating rickettsia using exchange proteins directly activated by camp (epacs) inhibitorsGONG BIN·Filed 2014·Application pending·0 cites
- 0643US8487641B2Pad structure and test methodGUO QIANG·Filed 2010·Granted Jul 16, 2013·0 cites·16 claims
- 0743US2023272696A1Method for deep-sea extraction of natural gas hydrates with reservoir top control and sand preventionUNIV SHANDONG SCIENCE & TECH·Filed 2023·Application pending·0 cites
- 0843US2012001872A1Electronic book reading device and method thereofGONG BIN·Filed 2010·Application pending·0 cites
- 0939US2011241554A1Electronic bookHONGFUJIN PREC IND SHENZHEN·Filed 2010·Application pending·0 cites
- 1034US2011012613A1Failure Detection Method and Failure Detection ApparatusSEMICONDUCTOR MFG INT SHANGHAI·Filed 2010·Application pending·0 cites
- 1132US2011285616A1Electronic bookGONG BIN·Filed 2010·Application pending·0 cites
- 1232US2011074459A1Structure and method for semiconductor testingSEMICONDUCTOR MFG INT SHANGHAI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →