Inventor · disambiguated record
Bi-Ling Lin
Also filed as: LIN BI-LING
12 granted patents·76 citations·filing 1998–2022
89Inventor score
Top patents by PatentIndex Score
12 records- 0192US10304772B2Semiconductor device structure with resistive elementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted May 28, 2019·7 cites·20 claims
- 0290US11404369B2Semiconductor device structure with resistive elementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 2, 2022·5 cites·20 claims
- 0381US8648592B2Semiconductor device components and methodsLIN BI-LING·Filed 2011·Granted Feb 11, 2014·7 cites·20 claims
- 0479US6548363B1Method to reduce the gate induced drain leakage current in CMOS devicesTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Apr 15, 2003·23 cites·17 claims
- 0577US7646207B2Method for measuring a property of interconnections and structure for the sameTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Jan 12, 2010·7 cites·20 claims
- 0675US11901289B2Semiconductor device structure with resistive elementTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Feb 13, 2024·0 cites·20 claims
- 0756US10978440B2Circuit layout methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Apr 13, 2021·0 cites·20 claims
- 0854US10403621B2Circuit layout, layout method and system for implementing the methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Sep 3, 2019·0 cites·20 claims
- 0953US9875964B2Semiconductor device components and methodsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jan 23, 2018·0 cites·21 claims
- 1053US8848374B2Method and structure for dissipating heat away from a resistor having neighboring devices and interconnectsLIN JIAN-HONG·Filed 2010·Granted Sep 30, 2014·1 cites·20 claims
- 1148US6284579B1Drain leakage reduction by indium transient enchanced diffusion (TED) for low power applicationsTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Sep 4, 2001·13 cites·4 claims
- 1245US6100150AProcess to improve temperature uniformity during RTA by deposition of in situ poly on the wafer backsideTAIWAN SEMICONDUCTOR MFG·Filed 1998·Granted Aug 8, 2000·13 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →