Inventor · disambiguated record
Bicheng Liu
Also filed as: LIU BICHENG
20 granted patents·9 pending applications·26 citations·filing 2016–2022
90Inventor score
Top patents by PatentIndex Score
29 records- 0188US11112528B2Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the sameNUCTECH CO LTD·Filed 2017·Granted Sep 7, 2021·3 cites·12 claims
- 0288US10586324B2Inspection devices and methods for inspecting a containerNUCTECH CO LTD·Filed 2017·Granted Mar 10, 2020·7 cites·15 claims
- 0387US10388818B2Semiconductor detectorNUCTECH CO LTD·Filed 2017·Granted Aug 20, 2019·5 cites·12 claims
- 0483US10646179B2Multi-energy spectrum x-ray imaging systems and methods for recognizing article using multi-energy spectrum x-ray imaging systemNUCTECH CO LTD·Filed 2017·Granted May 12, 2020·5 cites·15 claims
- 0582US10295679B2Semiconductor detectorNUCTECH CO LTD·Filed 2017·Granted May 21, 2019·3 cites·20 claims
- 0675US10613247B2Method, apparatus and system for inspecting object based on cosmic rayUNIV TSINGHUA·Filed 2017·Granted Apr 7, 2020·2 cites·18 claims
- 0764US11699223B2Image data processing method, device and security inspection system based on VR or ARNUCTECH CO LTD·Filed 2017·Granted Jul 11, 2023·1 cites·11 claims
- 0858US12298261B2Backscatter imaging device, control method and inspection systemNUCTECH CO LTD·Filed 2021·Granted May 13, 2025·0 cites·15 claims
- 0957US11614413B2Back scattering inspection system and back scattering inspection methodUNIV TSINGHUA·Filed 2020·Granted Mar 28, 2023·0 cites·16 claims
- 1055US10101473B2Semiconductor detectorNUCTECH CO LTD·Filed 2017·Granted Oct 16, 2018·0 cites·12 claims
- 1155US2024302299A1Inspection system and methodNUCTECH CO LTD·Filed 2022·Application pending·0 cites
- 1254US2024319114A1Inspection system and methodNUCTECH CO LTD·Filed 2022·Application pending·0 cites
- 1353US2024312753A1Radiation inspection system and methodNUCTECH CO LTD·Filed 2022·Application pending·0 cites
- 1453US2024411045A1Mobile radiation inspection apparatus and mobile radiation inspection systemNUCTECH BEIJING COMPANY LTD·Filed 2022·Application pending·0 cites
- 1551US2025035569A1Security inspection device, security inspection system, and security inspection methodNUCTECH BEIJING COMPANY LTD·Filed 2022·Application pending·0 cites
- 1650US10884156B2Image processing method, device, and computer readable storage mediumNUCTECH CO LTD·Filed 2018·Granted Jan 5, 2021·0 cites·20 claims
- 1748US11055869B2Security inspection based on scanned imagesNUCTECH CO LTD·Filed 2018·Granted Jul 6, 2021·0 cites·20 claims
- 1848US10670743B2Semiconductor detector and method for packaging the sameNUCTECH CO LTD·Filed 2017·Granted Jun 2, 2020·0 cites·18 claims
- 1947US11619599B2Substance identification device and method for extracting statistical feature based on cluster analysisUNIV TSINGHUA·Filed 2020·Granted Apr 4, 2023·0 cites·12 claims
- 2047US2024319112A1Inspection system and methodNUCTECH CO LTD·Filed 2022·Application pending·0 cites
- 2146US10663607B2Apparatuses for processing signals for a plurality of energy regions, and systems and methods for detecting radiation of a plurality of energy regionsNUCTECH CO LTD·Filed 2017·Granted May 26, 2020·0 cites·9 claims
- 2245US10448904B2Decomposition method and apparatus based on basis material combinationUNIV TSINGHUA·Filed 2018·Granted Oct 22, 2019·0 cites·10 claims
- 2342US2018156741A1Inspection devices and inspection methodsNUCTECH CO LTD·Filed 2017·Application pending·0 cites
- 2441US11812002B2Method and device for correcting a scanned image and image scanning systemNUCTECH CO LTD·Filed 2021·Granted Nov 7, 2023·0 cites·16 claims
- 2541US2023190654A1Dexamethasone-loaded macrophage-derived microvesicle as well as preparation method and application thereofUNIV SOUTHEAST·Filed 2018·Application pending·0 cites
- 2640US11346975B2Spiral CT device and Three-dimensional image reconstruction methodNUCTECH CO LTD·Filed 2017·Granted May 31, 2022·0 cites·18 claims
- 2740US10620336B2Method, device and system for inspecting moving object based on cosmic raysUNIV TSINGHUA·Filed 2017·Granted Apr 14, 2020·0 cites·20 claims
- 2838US10285252B2Dual-energy ray scanning system, scanning method and inspecting systemNUCTECH CO LTD·Filed 2016·Granted May 7, 2019·0 cites·13 claims
- 2937US2018059264A1Detector, and detecting system and method for dividing energy regions intelligentlyNUCTECH CO LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →