Inventor · disambiguated record
Boris Afinogenov
Also filed as: AFINOGENOV BORIS
1 granted patent·1 pending application·1 citations·filing 2020–2021
17Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0177US11823961B2Substrate inspection system and method of manufacturing semiconductor device using substrate inspection systemSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 21, 2023·1 cites·20 claims
- 0248US2022120662A1Particle inspection device based on spatial modulation method and particle inspection method using the particle inspection deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →