Inventor · disambiguated record
Boaz Cohen
Also filed as: COHEN BOAZ
31 granted patents·3 pending applications·60 citations·filing 2004–2024
95Inventor score
Top patents by PatentIndex Score
34 records- 0193US11379972B2Detecting defects in semiconductor specimens using weak labelingAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jul 5, 2022·5 cites·19 claims
- 0291US11205119B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 21, 2021·11 cites·20 claims
- 0390US11151710B1Automatic selection of algorithmic modules for examination of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Oct 19, 2021·6 cites·17 claims
- 0487US10832092B2Method of generating a training set usable for examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Nov 10, 2020·8 cites·11 claims
- 0586US12183066B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Dec 31, 2024·1 cites·17 claims
- 0684US11423529B2Determination of defect location for examination of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Aug 23, 2022·2 cites·20 claims
- 0782US11199506B2Generating a training set usable for examination of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Dec 14, 2021·3 cites·16 claims
- 0882US11138507B2System, method and computer program product for classifying a multiplicity of itemsAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Oct 5, 2021·5 cites·20 claims
- 0980US11348224B2Mask inspection of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted May 31, 2022·2 cites·20 claims
- 1080US11348001B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 31, 2022·3 cites·20 claims
- 1180US11010665B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted May 18, 2021·3 cites·18 claims
- 1278US11449711B2Machine learning-based defect detection of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Sep 20, 2022·2 cites·20 claims
- 1376US11276160B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 15, 2022·2 cites·17 claims
- 1474US11568531B2Method of deep learning-based examination of a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 31, 2023·1 cites·20 claims
- 1570US11790515B2Detecting defects in semiconductor specimens using weak labelingAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Oct 17, 2023·0 cites·20 claims
- 1670US11037286B2Method of classifying defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jun 15, 2021·2 cites·20 claims
- 1769US11756188B2Determining a critical dimension variation of a patternAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Sep 12, 2023·0 cites·14 claims
- 1869US9904995B2System and method for patch based inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Feb 27, 2018·2 cites·14 claims
- 1964US11983867B2Mask inspection of a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted May 14, 2024·0 cites·20 claims
- 2064US11940390B2Selecting a representative subset of potential defects to improve defect classifier training and estimation of expected defects of interestAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Mar 26, 2024·0 cites·20 claims
- 2155US11360030B2Selecting a coreset of potential defects for estimating expected defects of interestAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 14, 2022·0 cites·16 claims
- 2252US12498333B2Defect offset correction for examination of semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Granted Dec 16, 2025·0 cites·20 claims
- 2348US12400319B2Defect examination on a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Aug 26, 2025·0 cites·18 claims
- 2448US12361531B2Machine learning-based classification of defects in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jul 15, 2025·0 cites·18 claims
- 2548US11263741B2System and methods of generating comparable regions of a lithographic maskAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 1, 2022·0 cites·19 claims
- 2648US10605745B2Guided inspection of a semiconductor wafer based on systematic defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Mar 31, 2020·0 cites·17 claims
- 2746US9568283B2Enclosure protecting system and methodBRILL ALON·Filed 2009·Granted Feb 14, 2017·2 cites·26 claims
- 2846US2005128217A1Device, system and method for video signal modificationFiled 2004·Application pending·0 cites
- 2943US10921334B2System, method and computer program product for classifying defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Feb 16, 2021·0 cites·12 claims
- 3042US2007040045A1Rotary sprinkler with reduced wearCOHEN BOAZ·Filed 2004·Application pending·0 cites
- 3140US9927375B2System and method for printability based inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Mar 27, 2018·0 cites·13 claims
- 3239US11321633B2Method of classifying defects in a specimen semiconductor examination and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted May 3, 2022·0 cites·19 claims
- 3338US11151706B2Method of classifying defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Oct 19, 2021·0 cites·9 claims
- 3438US2009024046A1Apparatus and method for detection of one lung intubation by monitoring soundsUNIV BEN GURION·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →