Inventor · disambiguated record
Bo-Shiang Fang
Also filed as: FANG BO · FANG BO-SHIANG
9 granted patents·4 pending applications·19 citations·filing 2011–2025
81Inventor score
Top patents by PatentIndex Score
13 records- 0183US8305182B1Symmetric differential inductor structureTSAI MING-FAN·Filed 2011·Granted Nov 6, 2012·9 cites·9 claims
- 0276US9196941B2Cross-coupled bandpass filterCHUANG MIN-HAN·Filed 2012·Granted Nov 24, 2015·6 cites·6 claims
- 0361US8736059B2Interconnecting mechanism for 3D integrated circuitTSAI MING-FAN·Filed 2011·Granted May 27, 2014·2 cites·16 claims
- 0458US2025239823A1Outlet socket including printed circuit board-implemented antennaHONEYWELL INT INC·Filed 2025·Application pending·0 cites
- 0556US9281557B2Multi bandwidth balun and circuit structure thereofSILICONWARE PRECISION INDUSTRIES CO LTD·Filed 2013·Granted Mar 8, 2016·1 cites·30 claims
- 0655US9054670B2Cross-coupled bandpass filterCHUANG MIN-HAN·Filed 2012·Granted Jun 9, 2015·1 cites·6 claims
- 0751US2025239756A1Compact printed circuit board implemented antennaHONEYWELL INT INC·Filed 2025·Application pending·0 cites
- 0849US9698090B2Semiconductor substrate and fabrication method thereofSILICONWARE PRECISION INDUSTRIES CO LTD·Filed 2013·Granted Jul 4, 2017·0 cites·8 claims
- 0945US2017271251A1Fabrication method of semiconductor substrateSILICONWARE PRECISION INDUSTRIES CO LTD·Filed 2017·Application pending·0 cites
- 1042US8493168B2Asymmetric differential inductorTSAI MING-FAN·Filed 2011·Granted Jul 23, 2013·0 cites·11 claims
- 1141US2014184261A1Testing apparatus and testing methodSILICONWARE PRECISION INDUSTRIES CO LTD·Filed 2013·Application pending·0 cites
- 1239US9503043B2Duplexer, circuit structure thereof and RF transceiver apparatus comprising the duplexerSILICONWARE PRECISION INDUSTRIES CO LTD·Filed 2013·Granted Nov 22, 2016·0 cites·29 claims
- 1339US8399965B2Layer structure with EMI shielding effectTSAI MING-FAN·Filed 2011·Granted Mar 19, 2013·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →