Inventor · disambiguated record
Bokyoung Kang
Also filed as: KANG BOKYOUNG
1 granted patent·1 pending application·2 citations·filing 2015–2022
18Inventor score
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0162US10254333B2Method of generating quality affecting factor for semiconductor manufacturing process and generating system for the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Apr 9, 2019·2 cites·20 claims
- 0242US2023085028A1Method of detecting abnormalitySAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →