Inventor · disambiguated record
Bor-Zen Tien
Also filed as: TIEN BOR-ZEN
41 granted patents·2 pending applications·126 citations·filing 1999–2024
97Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD34TAIWAN SEMICONDUCTOR MFG8TAIWAN SEMICONDUCTOR MANUFACTRING COMPANY LTD1
Top patents by PatentIndex Score
43 records- 0194US9184087B2Mechanisms for forming FinFETs with different fin heightsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Nov 10, 2015·12 cites·20 claims
- 0292US10515902B2Back-end-of-line (BEOL) arrangement with multi-height interlayer dielectric (ILD) structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 24, 2019·6 cites·20 claims
- 0390US9412866B2BEOL selectivity stress filmTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Aug 9, 2016·13 cites·20 claims
- 0490US9349688B2Systems and methods to enhance passivation integrityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 24, 2016·5 cites·20 claims
- 0590US9076804B2Systems and methods to enhance passivation integrityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jul 7, 2015·7 cites·20 claims
- 0688US11621343B2Method of manufacturing semiconductor devices and semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Apr 4, 2023·1 cites·20 claims
- 0788US11101360B2Method of manufacturing a semiconductor device and a semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 24, 2021·4 cites·20 claims
- 0883US2024322011A1Method of manufacturing semiconductor devices and semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0982US12040381B2Method of manufacturing semiconductor devices and semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jul 16, 2024·0 cites·20 claims
- 1082US10957653B2Methods for manufacturing semiconductor arrangements using photoresist masksTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Mar 23, 2021·2 cites·20 claims
- 1182US9559011B2Mechanisms for forming FinFETs with different fin heightsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 31, 2017·2 cites·19 claims
- 1281US9070687B2Semiconductor device with self-protecting fuseTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jun 30, 2015·4 cites·20 claims
- 1381US6294448B1Method to improve TiSix salicide formationTAIWAN SEMICONDUCTOR MFG·Filed 2000·Granted Sep 25, 2001·31 cites·27 claims
- 1479US9122828B2Apparatus and method for designing an integrated circuit layout having a plurality of cell technologiesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Sep 1, 2015·5 cites·18 claims
- 1578US11075269B2Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 27, 2021·2 cites·20 claims
- 1678US9870998B2Semiconductor arrangement having an overlay alignment mark with a height shorter than a neighboring gate structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jan 16, 2018·2 cites·20 claims
- 1777US10134626B2Mechanisms for forming FinFETs with different fin heightsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Nov 20, 2018·1 cites·20 claims
- 1875US9842761B2Mechanisms for forming FinFETs with different fin heightsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 12, 2017·1 cites·20 claims
- 1973US9178066B2Methods for forming a semiconductor arrangement with structures having different heightsTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 3, 2015·2 cites·20 claims
- 2069US9508590B2Methods and apparatus of metal gate transistorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Nov 29, 2016·1 cites·20 claims
- 2166US11069791B2Method of manufacturing semiconductor devices and semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 20, 2021·0 cites·20 claims
- 2266US11011419B2Method for forming interconnect structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 18, 2021·0 cites·20 claims
- 2366US10777480B2Systems and methods to enhance passivation integrityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Sep 15, 2020·0 cites·20 claims
- 2466US7998772B2Method to reduce leakage in a protection diode structureTAIWAN SEMICONDUCTOR MFG·Filed 2009·Granted Aug 16, 2011·3 cites·14 claims
- 2564US11990510B2Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted May 21, 2024·0 cites·20 claims
- 2664US10515866B2Systems and methods to enhance passivation integrityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 24, 2019·0 cites·20 claims
- 2763US7663164B2Semiconductor device with reduced leakage protection diodeTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Feb 16, 2010·3 cites·10 claims
- 2859US10157810B2Systems and methods to enhance passivation integrityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Dec 18, 2018·0 cites·20 claims
- 2958US9773716B2Systems and methods to enhance passivation integrityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Sep 26, 2017·0 cites·20 claims
- 3057US2024282820A1Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 3155US10629481B2Method for forming interconnect structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Apr 21, 2020·0 cites·20 claims
- 3255US10014251B2Semiconductor device with self-protecting fuse and method of fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jul 3, 2018·0 cites·20 claims
- 3352US9299658B2Semiconductor device with self-protecting fuse and method of fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Mar 29, 2016·0 cites·20 claims
- 3452US9190319B2Method for forming interconnect structureTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Nov 17, 2015·0 cites·19 claims
- 3552US6346449B1Non-distort spacer profile during subsequent processingTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Feb 12, 2002·13 cites·11 claims
- 3651US9716034B2Method for forming interconnect structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Jul 25, 2017·0 cites·20 claims
- 3751US9093373B2Conductive diffusion barrier structure for ohmic contactsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jul 28, 2015·0 cites·20 claims
- 3850US10347766B2Semiconductor device and method of fabricating the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jul 9, 2019·0 cites·20 claims
- 3948US9252259B2Methods and apparatus of metal gate transistorsTAIWAN SEMICONDUCTOR MANUFACTRING COMPANY LTD·Filed 2013·Granted Feb 2, 2016·0 cites·20 claims
- 4047US9299621B2Smart measurement techniques to enhance inline process control stabilityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Mar 29, 2016·0 cites·20 claims
- 4147US9093528B2Stress compensation layer to improve device uniformityTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jul 28, 2015·0 cites·20 claims
- 4245US8860151B2Semiconductor device having a spacer and a liner overlying a sidewall of a gate structure and method of forming the sameTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Oct 14, 2014·0 cites·20 claims
- 4339US6284611B1Method for salicide process using a titanium nitride barrier layerTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Sep 4, 2001·6 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →