Inventor · disambiguated record
Bojko Vodanovic
Also filed as: VODANOVIC BOJKO
8 granted patents·94 citations·filing 1993–2011
86Inventor score
Top patents by PatentIndex Score
8 records- 0186US7551272B2Method and an apparatus for simultaneous 2D and 3D optical inspection and acquisition of optical inspection data of an objectACERIS 3D INSPECTION INC·Filed 2005·Granted Jun 23, 2009·16 cites·24 claims
- 0272US8144968B2Method and apparatus for scanning substratesVODANOVIC BOJKO·Filed 2009·Granted Mar 27, 2012·7 cites·21 claims
- 0371US6885400B1CCD imaging device and method for high speed profilingFiled 2000·Granted Apr 26, 2005·11 cites·15 claims
- 0466US8695990B2Wafer flattening apparatus and methodVODANOVIC BOJKO·Filed 2011·Granted Apr 15, 2014·3 cites·19 claims
- 0561US7535560B2Method and system for the inspection of integrated circuit devices having leadsACERIS 3D INSPECTION INC·Filed 2007·Granted May 19, 2009·1 cites·16 claims
- 0656US5406372AQFP lead quality inspection system and methodMODULAR VISION SYSTEMS INC·Filed 1993·Granted Apr 11, 1995·36 cites·6 claims
- 0753US6335757B1CCD imaging device for high speed profilingFiled 1997·Granted Jan 1, 2002·17 cites·16 claims
- 0843US7012631B2Absolute position determination for a CCD-based acquisition unitVODANOVIC BOJKO·Filed 2002·Granted Mar 14, 2006·3 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →