Inventor · disambiguated record
Bonnie E. Weir
Also filed as: WEIR BONNIE · WEIR BONNIE E · WEIR BONNIE ELAINE
9 granted patents·153 citations·filing 1996–2013
87Inventor score
Top patents by PatentIndex Score
9 records- 0195US7898277B2Hot-electronic injection testing of transistors on a waferAGERE SYSTEMS INC·Filed 2008·Granted Mar 1, 2011·62 cites·19 claims
- 0282US7332924B2Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failureAGERE SYSTEMS INC·Filed 2005·Granted Feb 19, 2008·12 cites·17 claims
- 0379US8875070B2Breaking up long-channel field effect transistor into smaller segments for reliability modelingLSI CORP·Filed 2013·Granted Oct 28, 2014·5 cites·14 claims
- 0476US8775994B2Using entire area of chip in TDDB checkingLSI CORP·Filed 2013·Granted Jul 8, 2014·5 cites·16 claims
- 0574US5804975ADetecting breakdown in dielectric layersLUCENT TECHNOLOGIES INC·Filed 1996·Granted Sep 8, 1998·38 cites·19 claims
- 0669US6043662ADetecting defects in integrated circuitsFiled 1998·Granted Mar 28, 2000·31 cites·11 claims
- 0743US8241986B2Semiconductor device and process for reducing damaging breakdown in gate dielectricsKOOK TAEHO·Filed 2011·Granted Aug 14, 2012·0 cites·8 claims
- 0842US8089130B2Semiconductor device and process for reducing damaging breakdown in gate dielectricsKOOK TAEHO·Filed 2006·Granted Jan 3, 2012·0 cites·10 claims
- 0935US8624352B2Mitigation of detrimental breakdown of a high dielectric constant metal-insulator-metal capacitor in a capacitor bankWEIR BONNIE E·Filed 2010·Granted Jan 7, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →