Inventor · disambiguated record
Brett Crump
Also filed as: CRUMP BRETT
10 granted patents·2 pending applications·131 citations·filing 2002–2007
89Inventor score
Top patents by PatentIndex Score
12 records- 0194US6924653B2Selectively configurable microelectronic probesMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 2, 2005·71 cites·42 claims
- 0286US6841991B2Planarity diagnostic system, E.G., for microelectronic component test systemsMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 11, 2005·27 cites·19 claims
- 0381US7170304B2Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 30, 2007·8 cites·12 claims
- 0480US7459923B2Probe interposers and methods of fabricating probe interposersMICRON TECHNOLOGY INC·Filed 2006·Granted Dec 2, 2008·11 cites·24 claims
- 0566US7019512B2Planarity diagnostic system, e.g., for microelectronic component test systemsMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 28, 2006·9 cites·16 claims
- 0658US7253608B2Planarity diagnostic system, e.g., for microelectronic component test systemsMICRON TECHNOLOGY INC·Filed 2007·Granted Aug 7, 2007·2 cites·5 claims
- 0747US6952109B2Selectively configurable probe structures, e.g., for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 4, 2005·2 cites·21 claims
- 0842US7211997B2Planarity diagnostic system, E.G., for microelectronic component test systemsMICRON TECHNOLOGY INC·Filed 2006·Granted May 1, 2007·0 cites·17 claims
- 0942US7145355B2Selectively configurable probe structures, e.g., for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 5, 2006·0 cites·9 claims
- 1042US6972580B2Selectively configurable probe structures, e.g., for testing microelectronic componentsMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 6, 2005·1 cites·16 claims
- 1138US2007245552A1Probe interposers and methods of fabricating probe interposersCALDWELL JOHN·Filed 2006·Application pending·0 cites
- 1235US2008044623A1Probe card for testing imaging devices, and methods of fabricating sameCALDWELL JOHN·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →