Inventor · disambiguated record
Brett Debenham
Also filed as: DEBENHAM BRETT · DEBENHAM BRETT M
15 granted patents·592 citations·filing 1996–2003
95Inventor score
Files withMICRON TECHNOLOGY INC15
Top patents by PatentIndex Score
15 records- 0196US6365421B2Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·118 cites·41 claims
- 0294US6194738B1Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 27, 2001·102 cites·51 claims
- 0390US6219810B1Intelligent binning for electrically repairable semiconductor chipsMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 17, 2001·45 cites·41 claims
- 0490US5631862ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1996·Granted May 20, 1997·73 cites·18 claims
- 0589US5764650AIntelligent binning for electrically repairable semiconductor chipsMICRON TECHNOLOGY INC·Filed 1996·Granted Jun 9, 1998·94 cites·42 claims
- 0681US6321353B2Intelligent binning for electrically repairable semiconductor chipsMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 20, 2001·18 cites·41 claims
- 0781US6138256AIntelligent binning for electrically repairable semiconductor chipsMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 24, 2000·33 cites·42 claims
- 0877US5706238ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 6, 1998·36 cites·12 claims
- 0975US6587980B2Intelligent binning for electrically repairable semiconductor chipsMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 1, 2003·12 cites·40 claims
- 1073US6185705B1Method and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 6, 2001·28 cites·27 claims
- 1155US6983404B2Method and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 3, 2006·7 cites·21 claims
- 1255US6523144B2Intelligent binning for electrically repairable semiconductor chips and methodMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 18, 2003·4 cites·40 claims
- 1349US6154410AMethod and apparatus for reducing antifuse programming timeMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 28, 2000·11 cites·12 claims
- 1446US5982656AMethod and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 9, 1999·10 cites·34 claims
- 1543US7237158B2Intelligent binning for electrically repairable semiconductor chipsMICRON TECHNOLOGY INC·Filed 2003·Granted Jun 26, 2007·1 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →