Inventor · disambiguated record
Bruno J. Debeurre
Also filed as: DEBEURRE BRUNO · DEBEURRE BRUNO J
12 granted patents·2 pending applications·41 citations·filing 2002–2017
88Inventor score
Files withFREESCALE SEMICONDUCTOR INC5DAR TEHMOOR M2ST MICROELECTRONICS INC2DEBEURRE BRUNO1FREESCALE SEMICONDUCTO INC1
Top patents by PatentIndex Score
14 records- 0181US9834438B2Compensation and calibration for MEMS devicesDAR TEHMOOR M·Filed 2015·Granted Dec 5, 2017·3 cites·19 claims
- 0281US9475689B2MEMS parameter identification using modulated waveformsFREESCALE SEMICONDUCTOR INC·Filed 2016·Granted Oct 25, 2016·2 cites·20 claims
- 0380US8569809B2Organic semiconductor sensor deviceTHOMAS DANIELLE A·Filed 2006·Granted Oct 29, 2013·14 cites·20 claims
- 0475US9335396B2MCU-based compensation and calibration for MEMS devicesDEBEURRE BRUNO·Filed 2013·Granted May 10, 2016·5 cites·20 claims
- 0567US9221679B2Compensation and calibration for MEMS devicesDAR TEHMOOR M·Filed 2014·Granted Dec 29, 2015·2 cites·20 claims
- 0665US9527731B2Methodology and system for wafer-level testing of MEMS pressure sensorsFREESCALE SEMICONDUCTOR INC·Filed 2014·Granted Dec 27, 2016·1 cites·16 claims
- 0761US7141839B2Organic semiconductor sensor deviceST MICROELECTRONICS INC·Filed 2004·Granted Nov 28, 2006·11 cites·20 claims
- 0857US10012673B2Compensation and calibration of multiple mass MEMS sensorNXP USA INC·Filed 2017·Granted Jul 3, 2018·0 cites·7 claims
- 0954US9797921B2Compensation and calibration of multiple mass MEMS sensorFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Oct 24, 2017·0 cites·9 claims
- 1049US9335340B2MEMS parameter identification using modulated waveformsSESSEGO RAIMONDO P·Filed 2013·Granted May 10, 2016·0 cites·20 claims
- 1147US6852996B2Organic semiconductor sensor deviceST MICROELECTRONICS INC·Filed 2002·Granted Feb 8, 2005·3 cites·8 claims
- 1243US9285404B2Test structure and methodology for estimating sensitivity of pressure sensorsFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Mar 15, 2016·0 cites·14 claims
- 1343US2016116361A1System for wafer-level testing of mems pressure sensorsFREESCALE SEMICONDUCTOR INC·Filed 2014·Application pending·0 cites
- 1430US2016264403A1Sensor device with multi-stimulus sensing and method of fabricationFREESCALE SEMICONDUCTO INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →