Inventor · disambiguated record
Brock J. Lameres
Also filed as: LAMERES BROCK J · LAMERES BROCK JEROME
16 granted patents·4 pending applications·301 citations·filing 2002–2024
93Inventor score
Top patents by PatentIndex Score
20 records- 0197US7025628B2Electronic probe extenderAGILENT TECHNOLOGIES INC·Filed 2003·Granted Apr 11, 2006·137 cites·12 claims
- 0294US11966284B1Fault-tolerant computer for reconfigurable hardware devicesUNIV MONTANA STATE·Filed 2023·Granted Apr 23, 2024·7 cites·20 claims
- 0394US7116121B1Probe assembly with controlled impedance spring pin or resistor tip spring pin contactsAGILENT TECHNOLOGIES INC·Filed 2005·Granted Oct 3, 2006·42 cites·15 claims
- 0488US12050688B1Malware-resistant obfuscated computer hardware for reconfigurable hardware devices and methods thereofUNIV MONTANA STATE·Filed 2024·Granted Jul 30, 2024·4 cites·20 claims
- 0587US6822466B1Alignment/retention device for connector-less probeAGILENT TECHNOLOGIES INC·Filed 2003·Granted Nov 23, 2004·36 cites·20 claims
- 0686US7046020B2Probes with perpendicularly disposed spring pins, and methods of making and using sameAGILENT TECHNOLOGIES INC·Filed 2004·Granted May 16, 2006·34 cites·16 claims
- 0778US7323892B1Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making sameAGILENT TECHNOLOGIES INC·Filed 2006·Granted Jan 29, 2008·9 cites·11 claims
- 0869US7242202B2Signal probe and probe assemblyAGILENT TECHNOLOGIES INC·Filed 2005·Granted Jul 10, 2007·6 cites·8 claims
- 0968US7242203B2Probe retention kit, and system and method for probing a pattern of points on a printed circuit boardAGILENT TECHNOLOGIES INC·Filed 2004·Granted Jul 10, 2007·13 cites·7 claims
- 1061US7338292B2Board-to-board electronic interface using hemi-ellipsoidal surface featuresAGILENT TECHNOLOGIES INC·Filed 2006·Granted Mar 4, 2008·1 cites·6 claims
- 1156US12287713B1Fault-tolerant computer system with configurable coprocessor component and methods thereofUNIV MONTANA STATE·Filed 2024·Granted Apr 29, 2025·0 cites·8 claims
- 1256US7282935B2Regenerator probeAGILENT TECHNOLOGIES INC·Filed 2006·Granted Oct 16, 2007·2 cites·26 claims
- 1354US7492173B2Probe accessories, and methods for probing test points using sameAGILENT TECHNOLOGIES INC·Filed 2006·Granted Feb 17, 2009·2 cites·19 claims
- 1453US7183781B2Incorporation of isolation resistor(s) into probes using probe tip spring pinsAGILENT TECHNOLOGIES INC·Filed 2004·Granted Feb 27, 2007·3 cites·9 claims
- 1550US7372284B2Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socketAGILENT TECHNOLOGIES INC·Filed 2006·Granted May 13, 2008·1 cites·16 claims
- 1649US7145352B2Apparatus, method, and kit for probing a pattern of points on a printed circuit boardAGILENT TECHNOLOGIES INC·Filed 2004·Granted Dec 5, 2006·4 cites·13 claims
- 1743US2007115014A1Incorporation of Isolation Resistor(s) into Probes using Probe Tip Spring PinsLAMERES BROCK J·Filed 2007·Application pending·0 cites
- 1843US2006249303A1Connectorless electronic interface between rigid and compliant members using hemi-ellipsoidal surface featuresJOHNSON KENNETH W·Filed 2005·Application pending·0 cites
- 1936US2006022692A1Backside attach probe, components thereof, and methods for making and using sameLAMERES BROCK J·Filed 2004·Application pending·0 cites
- 2035US2004007762A1Method for fabricating adaptor for aligning and electrically coupling circuit devices having dissimilar connectivity patternsFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →