Inventor · disambiguated record
Brian Mo
Also filed as: MO BRIAN · MO BRIAN S · MO BRIAN SZE-KI
45 granted patents·3 pending applications·2,598 citations·filing 1997–2020
99Inventor score
Top patents by PatentIndex Score
48 records- 0199US6429481B1Field effect transistor and method of its manufactureFAIRCHILD SEMICONDUCTOR·Filed 1997·Granted Aug 6, 2002·416 cites·22 claims
- 0298US7667604B2Context-aware and real-time item tracking system architecture and scenariosSAP AG·Filed 2008·Granted Feb 23, 2010·158 cites·20 claims
- 0398US6274905B1Trench structure substantially filled with high-conductivity materialFAIRCHILD SEMICONDUCTOR·Filed 1999·Granted Aug 14, 2001·220 cites·19 claims
- 0496US11086768B1Identifying false positives in test case failures using combinatoricsIBM·Filed 2020·Granted Aug 10, 2021·6 cites·20 claims
- 0596US8131838B2Modular monitor service for smart item monitoringBORNHOEVD CHRISTOF·Filed 2006·Granted Mar 6, 2012·95 cites·13 claims
- 0696US7969306B2Context-aware and real-time item tracking system architecture and scenariosSAP AG·Filed 2003·Granted Jun 28, 2011·225 cites·51 claims
- 0796US7860968B2Hierarchical, multi-tiered mapping and monitoring architecture for smart itemsSAP AG·Filed 2006·Granted Dec 28, 2010·93 cites·22 claims
- 0896US7737857B2Context-aware and real-time item tracking system architecture and scenariosSAP AG·Filed 2008·Granted Jun 15, 2010·90 cites·21 claims
- 0996US6901304B2Item tracking system architectures providing real-time visibility to supply chainSAP AG·Filed 2002·Granted May 31, 2005·253 cites·13 claims
- 1095US8156208B2Hierarchical, multi-tiered mapping and monitoring architecture for service-to-device re-mapping for smart itemsBORNHOEVD CHRISTOF·Filed 2006·Granted Apr 10, 2012·62 cites·20 claims
- 1195US6710406B2Field effect transistor and method of its manufactureFAIRCHILD SEMICONDUCTOR·Filed 2002·Granted Mar 23, 2004·65 cites·32 claims
- 1294US8751644B2Modular monitor service for smart item monitoringBORNHOEVD CHRISTOF·Filed 2012·Granted Jun 10, 2014·29 cites·18 claims
- 1394US7395195B2Sensor network modeling and deploymentSAP AG·Filed 2004·Granted Jul 1, 2008·147 cites·20 claims
- 1493US8296413B2Device registration in a hierarchical monitor serviceBORNHOEVD CHRISTOF·Filed 2006·Granted Oct 23, 2012·52 cites·17 claims
- 1593US6828195B2Method of manufacturing a trench transistor having a heavy body regionFAIRCHILD SEMICONDUCTOR·Filed 2003·Granted Dec 7, 2004·43 cites·23 claims
- 1692US6696726B1Vertical MOSFET with ultra-low resistance and low gate chargeFAIRCHILD SEMICONDUCTOR·Filed 2000·Granted Feb 24, 2004·60 cites·10 claims
- 1792US6316806B1Trench transistor with a self-aligned sourceFAIRFIELD SEMICONDUCTOR CORP·Filed 1999·Granted Nov 13, 2001·102 cites·7 claims
- 1891US6737323B2Method of fabricating a trench structure substantially filled with high-conductivity materialFAIRCHILD SEMICONDUCTOR·Filed 2001·Granted May 18, 2004·52 cites·17 claims
- 1991US6583010B2Trench transistor with self-aligned sourceFAIRCHILD SEMICONDUCTOR·Filed 2001·Granted Jun 24, 2003·45 cites·14 claims
- 2091US6521497B2Method of manufacturing a field effect transistorFAIRCHILD SEMICONDUCTOR·Filed 2001·Granted Feb 18, 2003·37 cites·18 claims
- 2189US7817039B2Dynamic display of RFID and sensor dataSAP AG·Filed 2007·Granted Oct 19, 2010·19 cites·26 claims
- 2288US7511339B2Field effect transistor and method of its manufactureFAIRCHILD SEMICONDUCTOR·Filed 2003·Granted Mar 31, 2009·26 cites·51 claims
- 2388US6404007B1Trench transistor with superior gate dielectricFAIRCHILD SEMICONDUCTOR·Filed 1999·Granted Jun 11, 2002·64 cites·7 claims
- 2484US7378962B2Sensor node management and method for monitoring a seal condition of an enclosureSAP AG·Filed 2004·Granted May 27, 2008·43 cites·20 claims
- 2584US7250862B2Dynamic display of RFID and sensor dataSAP AG·Filed 2004·Granted Jul 31, 2007·25 cites·20 claims
- 2684US7148111B2Method of manufacturing a trench transistor having a heavy body regionFAIRCHILD SEMICONDUCTOR·Filed 2004·Granted Dec 12, 2006·19 cites·36 claims
- 2781US8417854B2Generic device integration within an auto-id systemWENG JIE·Filed 2004·Granted Apr 9, 2013·22 cites·20 claims
- 2880US8476133B2Method of manufacture and structure for a trench transistor having a heavy body regionMO BRIAN SZE-KI·Filed 2010·Granted Jul 2, 2013·4 cites·22 claims
- 2979US8101484B2Method of forming a FET having ultra-low on-resistance and low gate chargeBENCUYA IZAK·Filed 2010·Granted Jan 24, 2012·4 cites·30 claims
- 3078US7745289B2Method of forming a FET having ultra-low on-resistance and low gate chargeFAIRCHILD SEMICONDUCTOR·Filed 2004·Granted Jun 29, 2010·18 cites·13 claims
- 3178US7331527B2Exception reduction and event reordering in an item tracking systemSAP AG·Filed 2004·Granted Feb 19, 2008·13 cites·18 claims
- 3278US7327248B2Generating electronic sealsSAP AG·Filed 2004·Granted Feb 5, 2008·15 cites·21 claims
- 3374US7765105B2Graphically representing goods management in supply chainSAP AG·Filed 2004·Granted Jul 27, 2010·6 cites·17 claims
- 3474US7250855B2False alarm mitigation using a sensor networkSAP AG·Filed 2004·Granted Jul 31, 2007·28 cites·18 claims
- 3571US8710584B2FET device having ultra-low on-resistance and low gate chargeBENCUYA IZAK·Filed 2012·Granted Apr 29, 2014·2 cites·20 claims
- 3667US6103635ATrench forming process and integrated circuit device including a trenchFAIRCHILD SEMICONDUCTOR·Filed 1997·Granted Aug 15, 2000·38 cites·11 claims
- 3764US2006186998A1Association of business processes with scanning of physical objectsLIN TAO·Filed 2004·Application pending·0 cites
- 3857US7696571B2Method of manufacturing a trench transistor having a heavy body regionFAIRCHILD SEMICONDUCTOR·Filed 2008·Granted Apr 13, 2010·0 cites·24 claims
- 3954US11307975B2Machine code analysis for identifying software defectsIBM·Filed 2020·Granted Apr 19, 2022·0 cites·15 claims
- 4053US8044463B2Method of manufacturing a trench transistor having a heavy body regionFAIRCHILD SEMICONDUCTOR·Filed 2010·Granted Oct 25, 2011·0 cites·20 claims
- 4152US7736978B2Method of manufacturing a trench transistor having a heavy body regionFAIRCHILD SEMICONDUCTOR·Filed 2006·Granted Jun 15, 2010·0 cites·10 claims
- 4251US11176026B2Assignment of test case priorities based on combinatorial test design model analysisIBM·Filed 2020·Granted Nov 16, 2021·0 cites·17 claims
- 4346US6927134B2Method of forming a trench transistor having a superior gate dielectricFAIRCHILD SEMICONDUCTOR·Filed 2002·Granted Aug 9, 2005·2 cites·9 claims
- 4443US11663113B2Real time fault localization using combinatorial test design techniques and test case priority selectionIBM·Filed 2020·Granted May 30, 2023·0 cites·17 claims
- 4541US2002038886A1Method of forming trench transistor with self-aligned sourceFiled 2001·Application pending·0 cites
- 4639US2004142523A1Method of forming vertical mosfet with ultra-low on-resistance and low gate chargeFiled 2004·Application pending·0 cites
- 4737US10990256B2Modifying default display configurations for objects in a user interfaceSALESFORCE COM INC·Filed 2018·Granted Apr 27, 2021·0 cites·18 claims
- 4835US6638824B2Metal gate double diffusion MOSFET with improved switching speed and reduced gate tunnel leakageFAIRCHILD SEMICONDUCTOR·Filed 2002·Granted Oct 28, 2003·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →