Inventor · disambiguated record
Bruce D. Sudweeks
Also filed as: SUDWEEKS BRUCE D
2 granted patents·40 citations·filing 1995–2005
59Inventor score
Technology areasG01R
Top patents by PatentIndex Score
2 records- 0167US5606568AMethod and apparatus for performing serial and parallel scan testing on an integrated circuitMEGATEST CORP·Filed 1995·Granted Feb 25, 1997·38 cites·14 claims
- 0246US7509226B2Apparatus and method for testing non-deterministic device dataTERADYNE INC·Filed 2005·Granted Mar 24, 2009·2 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →