Inventor · disambiguated record
Brent Teasley
Also filed as: TEASLEY BRENT · TEASLEY BRENT F
3 granted patents·23 citations·filing 2000–2002
67Inventor score
Files withMEMC ELECTRONIC MATERIALS3
Top patents by PatentIndex Score
3 records- 0167US6613591B1Method of estimating post-polishing waviness characteristics of a semiconductor waferMEMC ELECTRONIC MATERIALS·Filed 2002·Granted Sep 2, 2003·12 cites·14 claims
- 0260US6514423B1Method for wafer processingMEMC ELECTRONIC MATERIALS·Filed 2000·Granted Feb 4, 2003·9 cites·16 claims
- 0342US6398631B1Method and apparatus to place wafers into and out of machineMEMC ELECTRONIC MATERIALS·Filed 2001·Granted Jun 4, 2002·2 cites·29 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →