Inventor · disambiguated record
Bradford Van Treuren
Also filed as: VAN TREUREN BRADFORD · VAN TREUREN BRADFORD G · VAN TREUREN BRADFORD GENE
19 granted patents·1 pending application·194 citations·filing 1990–2013
94Inventor score
Files withALCATEL LUCENT USA INC6LUCENT TECHNOLOGIES INC5GOYAL SURESH4PORTOLAN MICHELE2ALCATEL LUCENT1
Top patents by PatentIndex Score
20 records- 0193US8775884B2Method and apparatus for position-based scheduling for JTAG systemsPORTOLAN MICHELE·Filed 2011·Granted Jul 8, 2014·17 cites·27 claims
- 0292US8621301B2Method and apparatus for virtual in-circuit emulationGOYAL SURESH·Filed 2010·Granted Dec 31, 2013·13 cites·20 claims
- 0386US8495758B2Method and apparatus for providing scan chain securityGOYAL SURESH·Filed 2010·Granted Jul 23, 2013·7 cites·20 claims
- 0483US7962885B2Method and apparatus for describing components adapted for dynamically modifying a scan path for system-on-chip testingALCATEL LUCENT USA INC·Filed 2007·Granted Jun 14, 2011·12 cites·19 claims
- 0582US8533545B2Method and apparatus for system testing using multiple instruction typesGOYAL SURESH·Filed 2009·Granted Sep 10, 2013·10 cites·20 claims
- 0680US7949915B2Method and apparatus for describing parallel access to a system-on-chipALCATEL LUCENT USA INC·Filed 2007·Granted May 24, 2011·11 cites·21 claims
- 0779US8719649B2Method and apparatus for deferred scheduling for JTAG systemsPORTOLAN MICHELE·Filed 2011·Granted May 6, 2014·4 cites·21 claims
- 0875US7863912B2Circuit board testing system using free space optical communicationsALCATEL LUCENT USA INC·Filed 2007·Granted Jan 4, 2011·8 cites·23 claims
- 0975US7149943B2System for flexible embedded Boundary Scan testingLUCENT TECHNOLOGIES INC·Filed 2004·Granted Dec 12, 2006·22 cites·13 claims
- 1071US7958417B2Apparatus and method for isolating portions of a scan path of a system-on-chipALCATEL LUCENT USA INC·Filed 2008·Granted Jun 7, 2011·6 cites·21 claims
- 1171US7265556B2System and method for adaptable testing of backplane interconnections and a test tool incorporating the sameLUCENT TECHNOLOGIES INC·Filed 2005·Granted Sep 4, 2007·7 cites·20 claims
- 1268US7457987B2Test vector manager, method of managing test vectors and a test tool employing the manager and the methodLUCENT TECHNOLOGIES INC·Filed 2006·Granted Nov 25, 2008·7 cites·26 claims
- 1367US9183105B2Systems and methods for dynamic scan schedulingALCATEL LUCENT USA·Filed 2013·Granted Nov 10, 2015·2 cites·20 claims
- 1464US7958479B2Method and apparatus for describing and testing a system-on-chipALCATEL LUCENT USA INC·Filed 2007·Granted Jun 7, 2011·4 cites·24 claims
- 1563US8677198B2Method and apparatus for system testing using multiple processorsGOYAL SURESH·Filed 2009·Granted Mar 18, 2014·3 cites·32 claims
- 1661US7954022B2Apparatus and method for controlling dynamic modification of a scan pathALCATEL LUCENT USA INC·Filed 2008·Granted May 31, 2011·3 cites·20 claims
- 1761US5105368AMethod for improving robot accuracyAT & T BELL LAB·Filed 1990·Granted Apr 14, 1992·40 cites·2 claims
- 1855US6378094B1Method and system for testing cluster circuits in a boundary scan environmentLUCENT TECHNOLOGIES INC·Filed 1999·Granted Apr 23, 2002·18 cites·12 claims
- 1943US2007032999A1System and method for emulating hardware failures and method of testing system software incorporating the sameLUCENT TECHNOLOGIES INC·Filed 2005·Application pending·0 cites
- 2040US8014753B2Distributed base station test bus architecture in a wireless networkALCATEL LUCENT·Filed 2004·Granted Sep 6, 2011·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →