Inventor · disambiguated record
Burkhard Krisch
Also filed as: KRISCH BURKHARD · MULLER KARL-HEINZ
8 granted patents·181 citations·filing 1976–1996
88Inventor score
Files withSIEMENS AG8
Top patents by PatentIndex Score
8 records- 0195US4211924ATransmission-type scanning charged-particle beam microscopeSIEMENS AG·Filed 1979·Granted Jul 8, 1980·58 cites·9 claims
- 0293US4044255ACorpuscular-beam transmission-type microscope including an improved beam deflection systemSIEMENS AG·Filed 1976·Granted Aug 23, 1977·50 cites·1 claims
- 0381US4038543AScanning transmission electron microscope including an improved image detectorSIEMENS AG·Filed 1976·Granted Jul 26, 1977·22 cites·15 claims
- 0465US4044254AScanning corpuscular-beam transmission type microscope including a beam energy analyzerSIEMENS AG·Filed 1976·Granted Aug 23, 1977·11 cites·2 claims
- 0557US6035721AProcess for compensating for the incorrect operation of measuring devices caused by external influencesSIEMENS AG·Filed 1996·Granted Mar 14, 2000·19 cites·6 claims
- 0651US4097739ABeam deflection and focusing system for a scanning corpuscular-beam microscopeSIEMENS AG·Filed 1976·Granted Jun 27, 1978·6 cites·3 claims
- 0744US5691479APressure transducer with a housing for use with a conventionally packaged pressure sensorSIEMENS AG·Filed 1993·Granted Nov 25, 1997·12 cites·2 claims
- 0839US4044256ASupport stand for a corpuscular-beam microscopeSIEMENS AG·Filed 1976·Granted Aug 23, 1977·3 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →