Inventor · disambiguated record
Byeong-Hwan Cho
Also filed as: CHO BYEONG-HWAN
6 granted patents·1 pending application·53 citations·filing 2001–2012
83Inventor score
Top patents by PatentIndex Score
7 records- 0189US7737710B2Socket, and test apparatus and method using the socketSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Jun 15, 2010·19 cites·17 claims
- 0281US8242794B2Socket, and test apparatus and method using the socketCHO BYEONG-HWAN·Filed 2011·Granted Aug 14, 2012·6 cites·29 claims
- 0368US9459281B2Socket, and test apparatus and method using the socketCHO BYEONG-HWAN·Filed 2012·Granted Oct 4, 2016·2 cites·20 claims
- 0467US6751763B2Semiconductor device test method for optimizing test timeSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jun 15, 2004·13 cites·20 claims
- 0560US7479793B2Apparatus for testing semiconductor test system and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 20, 2009·5 cites·4 claims
- 0654US6580380B2Apparatus and method for testing linearity of an analog to digital converterSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 17, 2003·8 cites·14 claims
- 0746US2010231248A1Socket, and test apparatus and method using the socketSAMSUNG ELECTRONICS CO LTD·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →