Inventor · disambiguated record
Byoung Chan Choi
Also filed as: CHOI BYOUNG CHAN
4 granted patents·8 pending applications·2 citations·filing 2015–2022
58Inventor score
Files withADVANCED TECH INC5CHOI BYOUNG CHAN3LASERVALL TECH CO LTD2KOREA INST SCI & TECH1LASERVALL ASIA CO LTD1
Top patents by PatentIndex Score
12 records- 0164US11109959B2Intraocular lens and method of manufacturing the sameKOREA INST SCI & TECH·Filed 2019·Granted Sep 7, 2021·1 cites·8 claims
- 0259US11117214B2Laser irradiation device and methodCHOI BYOUNG CHAN·Filed 2015·Granted Sep 14, 2021·1 cites·15 claims
- 0359US2025033142A1Laser processing apparatus method including same and processed object processed therebyLASERVALL TECH CO LTD·Filed 2022·Application pending·0 cites
- 0458US2019143454A1Laser patterning apparatus for 3-dimensional object and methodADVANCED TECH INC·Filed 2018·Application pending·0 cites
- 0555US2020001397A1Laser processing apparatusADVANCED TECH INC·Filed 2019·Application pending·0 cites
- 0653US2023120590A1Laser soldering device applying multi nozzle and the method thereofCHOI BYOUNG CHAN·Filed 2022·Application pending·0 cites
- 0751US2025033130A1Laser soldering device with adjustable laser irradiation position and soldering method comprising sameLASERVALL TECH CO LTD·Filed 2022·Application pending·0 cites
- 0849US2018169789A1Laser processing apparatusADVANCED TECH INC·Filed 2017·Application pending·0 cites
- 0949US2020130103A1Laser patterning apparatus for 3-dimensional object and methodADVANCED TECH INC·Filed 2019·Application pending·0 cites
- 1047US2025108460A1Laser patterning apparatus of a processing object and a method thereof and a three-dimensional processing object processed therebyCHOI BYOUNG CHAN·Filed 2021·Application pending·0 cites
- 1133US10016250B2Laser patterning apparatus for three-dimensional objectADVANCED TECH INC·Filed 2017·Granted Jul 10, 2018·0 cites·10 claims
- 1230US11169385B2Laser optical device and headLASERVALL ASIA CO LTD·Filed 2016·Granted Nov 9, 2021·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →