Inventor · disambiguated record
Byoung-Ok Chun
Also filed as: CHUN BYOUNG-OK
3 granted patents·1 pending application·22 citations·filing 1999–2005
67Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0164US7472321B2Test apparatus for mixed-signal semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Dec 30, 2008·6 cites·17 claims
- 0260US7145489B2Tester for a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Dec 5, 2006·2 cites·19 claims
- 0336US6133727AMethod for verifying semiconductor device testerSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Oct 17, 2000·14 cites·16 claims
- 0427US2003154047A1Tester for mixed signal semiconductor device and method of testing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →