Inventor · disambiguated record
Byeong Hwan Jeon
Also filed as: JEON BYEONG HWAN
31 granted patents·15 pending applications·61 citations·filing 1992–2024
94Inventor score
Files withSAMSUNG ELECTRONICS CO LTD31HYUNDAI MOBIS CO LTD9BAEK DONG-SEOK1CHEIL IND INC1HASHIMOTO KOHEI1
Top patents by PatentIndex Score
46 records- 0198US11685402B2Autonomous driving apparatus and methodHYUNDAI MOBIS CO LTD·Filed 2020·Granted Jun 27, 2023·13 cites·2 claims
- 0287US11805407B2Apparatus and method for securely updating binary data in vehicleHYUNDAI MOBIS CO LTD·Filed 2020·Granted Oct 31, 2023·2 cites·8 claims
- 0387US11420653B2Autonomous driving apparatus and methodHYUNDAI MOBIS CO LTD·Filed 2020·Granted Aug 23, 2022·2 cites·6 claims
- 0487US10001444B2Surface inspecting methodSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jun 19, 2018·4 cites·19 claims
- 0587US9746430B2Optical inspecting apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Aug 29, 2017·4 cites·7 claims
- 0686US11654939B2Autonomous driving apparatus and method that outputs different warnings based on driving riskHYUNDAI MOBIS CO LTD·Filed 2020·Granted May 23, 2023·2 cites·14 claims
- 0785US9702826B2Method of inspecting a surface of an object and optical system for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jul 11, 2017·3 cites·18 claims
- 0881US8841824B2Broadband light illuminatorsSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Sep 23, 2014·5 cites·20 claims
- 0975US8163835B2Anisotropic conductive adhesive composition, anisotropic conductive film comprising the same, and associated methodsPARK KYOUNG SOO·Filed 2008·Granted Apr 24, 2012·9 cites·13 claims
- 1069US11615956B2Light generator including debris shielding assembly, photolithographic apparatus including the light generatorSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Mar 28, 2023·0 cites·18 claims
- 1169US10779388B2EUV generation deviceSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 15, 2020·1 cites·14 claims
- 1269US9425036B2Light source device and semiconductor manufacturing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Aug 23, 2016·2 cites·19 claims
- 1369US9305764B2Plasma light source, inspection apparatus including plasma light source, and method of generating plasma lightPARK YOUNG-KYU·Filed 2015·Granted Apr 5, 2016·2 cites·18 claims
- 1468US8873138B2Auto focusing devices for optical microscopesKIM KWANG SOO·Filed 2012·Granted Oct 28, 2014·2 cites·10 claims
- 1567US9839110B2Plasma light source apparatus and light source system including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 5, 2017·1 cites·20 claims
- 1665US8003017B2Adhesive composition and anisotropic conductive film using the sameCHEIL IND INC·Filed 2008·Granted Aug 23, 2011·1 cites·12 claims
- 1763US9374883B2Plasma light source apparatus and plasma light generating methodSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jun 21, 2016·2 cites·20 claims
- 1856US11114298B2Light generator including debris shielding assembly, photolithographic apparatus including the light generator, and method of manufacturing integrated circuit device using the photolithographic apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Sep 7, 2021·0 cites·18 claims
- 1954US2023365139A1Server and method for managing nft-based driver data for autonomous vehicleHYUNDAI MOBIS CO LTD·Filed 2022·Application pending·0 cites
- 2052US9255694B2Reflector structure of illumination optic systemSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Feb 9, 2016·0 cites·14 claims
- 2151US10890527B2EUV mask inspection apparatus and method, and EUV mask manufacturing method including EUV mask inspection methodSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jan 12, 2021·0 cites·15 claims
- 2251US2014002829A1Optical measurement apparatus and method of controlling the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 2351US2025100582A1Algorithm operation management apparatus and methodHYUNDAI MOBIS CO LTD·Filed 2024·Application pending·0 cites
- 2448US11479267B2Autonomous driving apparatus and methodHYUNDAI MOBIS CO LTD·Filed 2020·Granted Oct 25, 2022·0 cites·9 claims
- 2547US2015369588A1Optical measurement apparatus and method of controlling the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
- 2645US2020369293A1Autonomous driving apparatus and methodHYUNDAI MOBIS CO LTD·Filed 2020·Application pending·0 cites
- 2744US2013214180A1System and method for providing lightSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 2842US11560178B2Apparatus and method for displaying rear image of vehicleHYUNDAI MOBIS CO LTD·Filed 2019·Granted Jan 24, 2023·0 cites·16 claims
- 2942US2014198322A1Surface Profile Measurement SystemSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 3041US2014246584A1Scanning electron microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
- 3140US10473579B2Apparatus for inspecting material property of plurality of measurement objectsSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 12, 2019·0 cites·14 claims
- 3240US2019181020A1Method of forming nanorod structure and method of forming semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 3339US10733719B2Wafer inspection apparatus and wafer inspection method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 4, 2020·0 cites·3 claims
- 3439US9903705B2Apparatus for focus control and method for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Feb 27, 2018·0 cites·14 claims
- 3538US9546772B2Rod lens for lighting apparatus, lighting apparatus including the same and semiconductor manufacturing method using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Jan 17, 2017·0 cites·17 claims
- 3637US9983144B2Plasma light source and inspection apparatus including the sameHASHIMOTO KOHEI·Filed 2015·Granted May 29, 2018·0 cites·14 claims
- 3737US9897552B2Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 20, 2018·0 cites·8 claims
- 3837US5159250ARobot control methodSAMSUNG ELECTRONICS CO LTD·Filed 1992·Granted Oct 27, 1992·6 cites·4 claims
- 3936US10431505B2Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surfaceSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 1, 2019·0 cites·11 claims
- 4035US10338370B2Clock signal generators and substrate inspecting apparatuses having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jul 2, 2019·0 cites·18 claims
- 4135US2015355441A1Objective lens assembly having catadioptric groupSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
- 4235US2019094072A1Atomic emission spectrometer based on laser-induced plasma (lip), semiconductor manufacturing facility including the atomic emission spectrometer, and method of manufacturing semiconductor device using the atomic emission spectrometerSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 4335US2004141444A1Pickup inspecting apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2003·Application pending·0 cites
- 4434US2018144995A1Optical inspection apparatus and method and method of fabricating semiconductor device using the apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2017·Application pending·0 cites
- 4530US2007153262A1Inspecting apparatus and methodBAEK DONG-SEOK·Filed 2006·Application pending·0 cites
- 4629US2017124695A1Data processing apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →