Inventor · disambiguated record
Byeong-Yun Kim
Also filed as: KIM BYEONG-YUN
11 granted patents·3 pending applications·126 citations·filing 1987–2021
88Inventor score
Files withSAMSUNG ELECTRONICS CO LTD8KIM BYUNG KYU2PHOSPHIL INC2SAMSUNG SEMICONDUCTOR1SAMSUNG SEMICONDUCTORS & TELEC1
Top patents by PatentIndex Score
14 records- 0179US5396113AElectrically programmable internal power voltage generating circuitSAMSUNG ELECTRONICS CO LTD·Filed 1992·Granted Mar 7, 1995·48 cites·34 claims
- 0269US4972373APrecharge system in a SRAMSAMSUNG SEMICONDUCTORS & TELEC·Filed 1987·Granted Nov 20, 1990·33 cites·2 claims
- 0364US7706198B2Multi-chip and repairing method based on remaining redundancy cellsSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 27, 2010·6 cites·16 claims
- 0463US7429794B2Multi-chip packaged integrated circuit device for transmitting signals from one chip to another chipSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Sep 30, 2008·3 cites·20 claims
- 0554US5121356AWrite driver having a precharging meansSAMSUNG ELECTRONICS CO LTD·Filed 1990·Granted Jun 9, 1992·17 cites·11 claims
- 0652US5067109AData output buffer circuit for a SRAMSAMSUNG SEMICONDUCTOR·Filed 1988·Granted Nov 19, 1991·14 cites·5 claims
- 0748US11686772B2Self diagnostic apparatus for electronic devicePHOSPHIL INC·Filed 2021·Granted Jun 27, 2023·0 cites·11 claims
- 0845US11255886B2Current measurement apparatus including charge/discharge means and current measurement method using sameKIM BYUNG KYU·Filed 2018·Granted Feb 22, 2022·0 cites·16 claims
- 0941US11460502B2Processor-based measuring method for testing device under test, and measuring device using sameKIM BYUNG KYU·Filed 2018·Granted Oct 4, 2022·0 cites·13 claims
- 1038US2007152316A1Interposer pattern with pad chainSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1137US2007018300A1Apparatus and method for testing a multi-stack integrated circuit packageSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1236US11320483B2Method for testing device under test and apparatus using the samePHOSPHIL INC·Filed 2020·Granted May 3, 2022·0 cites·4 claims
- 1332US2005052799A1ESD protecting circuit embedded in an SIP chip using a plurality of power sourcesSAMSUNG ELECTRONICS CO LTD·Filed 2004·Application pending·0 cites
- 1430US5305279ASemiconductor memory device having word line selection logic circuitsSAMSUNG ELECTRONICS CO LTD·Filed 1992·Granted Apr 19, 1994·5 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →