Inventor · disambiguated record
Byung-Sug Lee
Also filed as: LEE BYUNG-SUG
4 granted patents·1 pending application·18 citations·filing 2005–2007
72Inventor score
Top patents by PatentIndex Score
5 records- 0177US7486392B2Method of inspecting for defects and apparatus for performing the methodSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Feb 3, 2009·6 cites·11 claims
- 0273US7385689B2Method and apparatus for inspecting substrate patternSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jun 10, 2008·5 cites·35 claims
- 0369US7446865B2Method of classifying defectsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 4, 2008·3 cites·17 claims
- 0467US7394279B2Method of measuring a surface voltage of an insulating layerSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jul 1, 2008·4 cites·15 claims
- 0538US2007202615A1Method of measuring critical dimensionLEE BYUNG-SUG·Filed 2007·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Byung-Sug Lee files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →