Inventor · disambiguated record
Byoungjun Min
Also filed as: MIN BYOUNGJUN
1 granted patent·2 pending applications·3 citations·filing 2012–2014
21Inventor score
Top patents by PatentIndex Score
3 records- 0169US9207272B2Test handler that rapidly transforms temperature and method of testing semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Dec 8, 2015·3 cites·17 claims
- 0234US2014306727A1Facility and a method for testing semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 0329US2013074447A1Carrier tape winding unit and apparatus of packing semiconductor packageKIM KI-HUN·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →