Inventor · disambiguated record
Byoung W. Min
Also filed as: MIN BYOUNG M · MIN BYOUNG W · MIN BYOUNG WOON · MIN BYOUNG-WOON B
35 granted patents·3 pending applications·480 citations·filing 1993–2021
97Inventor score
Files withFREESCALE SEMICONDUCTOR INC19HYUN DAI HEAVY IND CO LTD4MIN BYOUNG W4CHAKRAVARTI SATYA N2MOTOROLA INC2
Top patents by PatentIndex Score
38 records- 0196US8901632B1Non-volatile memory (NVM) and high-K and metal gate integration using gate-last methodologyFREESCALE SEMICONDUCTOR INC·Filed 2013·Granted Dec 2, 2014·40 cites·18 claims
- 0295US7410876B1Methodology to reduce SOI floating-body effectFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Aug 12, 2008·31 cites·19 claims
- 0394US7754560B2Integrated circuit using FinFETs and having a static random access memory (SRAM)FREESCALE SEMICONDUCTOR INC·Filed 2006·Granted Jul 13, 2010·27 cites·4 claims
- 0492US7709303B2Process for forming an electronic device including a fin-type structureFREESCALE SEMICONDUCTOR INC·Filed 2006·Granted May 4, 2010·24 cites·20 claims
- 0592US7013447B2Method for converting a planar transistor design to a vertical double gate transistor designFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Mar 14, 2006·63 cites·18 claims
- 0690US6838332B1Method for forming a semiconductor device having electrical contact from opposite sidesFREESCALE SEMICONDUCTOR INC·Filed 2003·Granted Jan 4, 2005·45 cites·14 claims
- 0789US11380373B1Memory with read circuit for current-to-voltage slope characteristic-based sensing and methodGLOBALFOUNDRIES US INC·Filed 2021·Granted Jul 5, 2022·6 cites·20 claims
- 0889US7820530B2Efficient body contact field effect transistor with reduced body resistanceFREESCALE SEMICONDUCTOR INC·Filed 2008·Granted Oct 26, 2010·15 cites·20 claims
- 0989US7452768B2Multiple device types including an inverted-T channel transistor and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Nov 18, 2008·14 cites·6 claims
- 1087US6724048B2Body-tied silicon on insulator semiconductor device and method thereforMOTOROLA INC·Filed 2003·Granted Apr 20, 2004·38 cites·5 claims
- 1185US7186596B2Vertical diode formation in SOI applicationFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Mar 6, 2007·13 cites·20 claims
- 1285US6620656B2Method of forming body-tied silicon on insulator semiconductor deviceMOTOROLA INC·Filed 2001·Granted Sep 16, 2003·34 cites·18 claims
- 1384US6921961B2Semiconductor device having electrical contact from opposite sides including a via with an end formed at a bottom surface of the diffusion regionFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Jul 26, 2005·28 cites·11 claims
- 1483US9082650B2Integrated split gate non-volatile memory cell and logic structurePERERA ASANGA H·Filed 2013·Granted Jul 14, 2015·7 cites·19 claims
- 1582US7041576B2Separately strained N-channel and P-channel transistorsFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted May 9, 2006·37 cites·21 claims
- 1679US7648884B2Semiconductor device with integrated resistive element and method of makingFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Jan 19, 2010·9 cites·18 claims
- 1778US8237457B2Replacement-gate-compatible programmable electrical antifuseCHAKRAVARTI SATYA N·Filed 2009·Granted Aug 7, 2012·8 cites·20 claims
- 1878US7122421B2Semiconductor device including a transistor and a capacitor having an aligned transistor and capacitive elementFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Oct 17, 2006·6 cites·8 claims
- 1974US8294239B2Effective eFuse structureMIN BYOUNG W·Filed 2008·Granted Oct 23, 2012·7 cites·23 claims
- 2069US7927934B2SOI semiconductor device with body contact and method thereofFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Apr 19, 2011·4 cites·19 claims
- 2161US7517742B2Area diode formation in SOI applicationFREESCALE SEMICONDUCTOR INC·Filed 2005·Granted Apr 14, 2009·2 cites·19 claims
- 2261US7144784B2Method of forming a semiconductor device and structure thereofFREESCALE SEMICONDUCTOR INC·Filed 2004·Granted Dec 5, 2006·9 cites·21 claims
- 2355US9279858B2Cubicle type gas insulated switchgear monitoring and diagnosis systemHYUN DAI HEAVY IND CO LTD·Filed 2013·Granted Mar 8, 2016·1 cites·8 claims
- 2451US9299856B2Selective gate oxide properties adjustment using fluorineFREESCALE SEMICONDUCTOR INC·Filed 2015·Granted Mar 29, 2016·0 cites·14 claims
- 2551US8975143B2Selective gate oxide properties adjustment using fluorineMIN BYOUNG W·Filed 2013·Granted Mar 10, 2015·0 cites·6 claims
- 2648US9059006B2Replacement-gate-compatible programmable electrical antifuseCHAKRAVARTI SATYA N·Filed 2012·Granted Jun 16, 2015·0 cites·20 claims
- 2746US7858505B2Method of forming a transistor having multiple types of Schottky junctionsFREESCALE SEMICONDUCTOR INC·Filed 2007·Granted Dec 28, 2010·0 cites·9 claims
- 2845US8088657B2Integrated circuit using FinFETs and having a static random access memory (SRAM)BURNETT JAMES D·Filed 2010·Granted Jan 3, 2012·0 cites·20 claims
- 2944US6844224B2Substrate contact in SOI and method thereforFREESCALE SEMICONDUCTOR INC·Filed 2001·Granted Jan 18, 2005·1 cites·11 claims
- 3043US10145836B2Apparatus for measuring dissolved gas and oil immersed transformer having the sameHYUN DAI HEAVY IND CO LTD·Filed 2016·Granted Dec 4, 2018·0 cites·5 claims
- 3142US5581305AAutomatic picture quality compensating method and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 1995·Granted Dec 3, 1996·10 cites·9 claims
- 3242US2006270551A1Absorbent and method for separating acid gases from gas mixtureJANG JYUNG R·Filed 2005·Application pending·0 cites
- 3341US2010078727A1eFuse and Resistor Structures and Method for Forming Same in Active RegionMIN BYOUNG W·Filed 2008·Application pending·0 cites
- 3439US9057755B2Device for monitoring internal arc in gas insulated switchgearHYUN DAI HEAVY IND CO LTD·Filed 2013·Granted Jun 16, 2015·0 cites·9 claims
- 3536US9448286B2Preventive diagnostic system for GIS based on IEC 61850HYUN DAI HEAVY IND CO LTD·Filed 2013·Granted Sep 20, 2016·0 cites·9 claims
- 3635US2005280088A1Backside body contactMIN BYOUNG W·Filed 2004·Application pending·0 cites
- 3734US11402340B2Method for detecting defect in insulating materialHYUNDAI ELECTRIC & ENERGY SYSTEMS CO LTD·Filed 2018·Granted Aug 2, 2022·0 cites·4 claims
- 3831US5535066AAutomatic monitoring method for a video cassette recorderSAMSUNG ELECTRONICS CO LTD·Filed 1993·Granted Jul 9, 1996·1 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →