Inventor · disambiguated record
Byong Chon Park
Also filed as: PARK BYONG CHON
6 granted patents·14 citations·filing 2007–2016
74Inventor score
Top patents by PatentIndex Score
6 records- 0178US10191081B2Measuring method for atomic force microscopeKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Jan 29, 2019·3 cites·9 claims
- 0277US8153338B2Apparatus and method for repairing photo maskPARK BYONG CHON·Filed 2010·Granted Apr 10, 2012·6 cites·10 claims
- 0373US7501618B2Deformation method of nanometer scale material using particle beam and nano tool therebyKOREA RES INST OF STANDARDS·Filed 2007·Granted Mar 10, 2009·5 cites·12 claims
- 0440US11087952B2Linear structure for displacement transmission, and one-dimensional and three-dimensional micro movement device using sameKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Aug 10, 2021·0 cites·15 claims
- 0538US9009861B2Substrate measurement apparatus with electron distortion unitPARK BYONG CHON·Filed 2011·Granted Apr 14, 2015·0 cites·10 claims
- 0631US9939461B2Head-integrated atomic force microscope and composite microscope including sameKOREA RES INST STANDARDS & SCI·Filed 2015·Granted Apr 10, 2018·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →