Inventor · disambiguated record
Byong-Hui Yun
Also filed as: YUN BYONG-HUI
1 granted patent·3 pending applications·3 citations·filing 2005–2007
21Inventor score
Top patents by PatentIndex Score
4 records- 0144US7274196B2Apparatus and method for testing electrical characteristics of semiconductor workpieceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Sep 25, 2007·3 cites·10 claims
- 0233US2006126248A1Method and apparatus for controlling device power supply in semiconductor testerSAMSUNG ELECTRONICS CO LTD·Filed 2005·Application pending·0 cites
- 0333US2007061659A1Methods for testing a plurality of semiconductor devices in parallel and related apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0432US2008068036A1Semiconductor test system capable of virtual test and semiconductor test method thereofYUN BYONG-HUI·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →