Inventor · disambiguated record
C. Patrick Doherty
Also filed as: DOHERTY C PATRICK
15 granted patents·1 pending application·1,170 citations·filing 1997–2006
96Inventor score
Top patents by PatentIndex Score
16 records- 0199US6359456B1Probe card and test system for semiconductor wafersMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 19, 2002·149 cites·25 claims
- 0299US6060891AProbe card for semiconductor wafers and method and system for testing wafersMICRON TECHNOLOGY INC·Filed 1997·Granted May 9, 2000·218 cites·21 claims
- 0396US6275052B1Probe card and testing method for semiconductor wafersMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 14, 2001·118 cites·25 claims
- 0496US6246245B1Probe card, test method and test system for semiconductor wafersMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 12, 2001·130 cites·16 claims
- 0594US6366112B1Probe card having on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 2, 2002·62 cites·21 claims
- 0694US6356098B1Probe card, test method and test system for semiconductor wafersMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 12, 2002·106 cites·10 claims
- 0794US6246250B1Probe card having on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 1998·Granted Jun 12, 2001·106 cites·19 claims
- 0891US6798224B1Method for testing semiconductor wafersMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 28, 2004·42 cites·12 claims
- 0989US6337577B1Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 8, 2002·65 cites·20 claims
- 1089US6300786B1Wafer test method with probe card having on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 1999·Granted Oct 9, 2001·63 cites·16 claims
- 1188US6466047B1System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 2001·Granted Oct 15, 2002·30 cites·26 claims
- 1287US6433574B1Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resourcesMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 13, 2002·29 cites·20 claims
- 1381US6677776B2Method and system having switching network for testing semiconductor components on a substrateMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 13, 2004·28 cites·55 claims
- 1474US6853211B2Method and system having switching network for testing semiconductor components on a substrateMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 8, 2005·18 cites·45 claims
- 1558US7250780B2Probe card for semiconductor wafers having mounting plate and socketMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 31, 2007·6 cites·26 claims
- 1638US2007291145A1Methods, devices, and systems for selectable repair of imaging devicesDOHERTY C PATRICK·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →