Inventor · disambiguated record
Camille P. Bowne
Also filed as: BOWNE CAMILLE P · BOWNE CAMILLE PROIETTI
2 granted patents·1 pending application·59 citations·filing 2000–2007
62Inventor score
Files withIBM3
Top patents by PatentIndex Score
3 records- 0190US6529021B1Self-scrub buckling beam probeIBM·Filed 2000·Granted Mar 4, 2003·54 cites·16 claims
- 0271US8025812B2Selective etch of TiW for capture pad formationIBM·Filed 2007·Granted Sep 27, 2011·5 cites·8 claims
- 0340US2008289764A1End point detection electrode system and etch stationIBM·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →