Inventor · disambiguated record
Carmel Yehuda Drillman
Also filed as: DRILLMAN CARMEL YEHUDA
4 granted patents·1 pending application·7 citations·filing 2022–2025
65Inventor score
Files withCAMTEK LTD5
Top patents by PatentIndex Score
5 records- 0191US11828713B1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2022·Granted Nov 28, 2023·4 cites·15 claims
- 0288US11927545B1Semiconductor edge and bevel inspection tool systemCAMTEK LTD·Filed 2023·Granted Mar 12, 2024·3 cites·25 claims
- 0376US2025290869A1Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2025·Application pending·0 cites
- 0474US12320757B2Semiconductor inspection tool system and method for wafer edge inspectionCAMTEK LTD·Filed 2023·Granted Jun 3, 2025·0 cites·31 claims
- 0557US12315206B2Inspection system for edge and bevel inspection of semiconductor structuresCAMTEK LTD·Filed 2024·Granted May 27, 2025·0 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when Carmel Yehuda Drillman files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →