Inventor · disambiguated record
Carsten Ohlhoff
Also filed as: OHLHOFF CARSTEN
17 granted patents·2 pending applications·301 citations·filing 2000–2008
94Inventor score
Top patents by PatentIndex Score
19 records- 0196US7231562B2Memory module, test system and method for testing one or a plurality of memory modulesINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 12, 2007·158 cites·21 claims
- 0277US6756787B2Integrated circuit having a current measuring unitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 29, 2004·21 cites·9 claims
- 0374US6504394B2Configuration for trimming reference voltages in semiconductor chips, in particular semiconductor memoriesINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jan 7, 2003·18 cites·6 claims
- 0472US6671221B2Semiconductor chip with trimmable oscillatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 30, 2003·19 cites·9 claims
- 0566US7490274B2Method and apparatus for masking known fails during memory tests readoutsINFINEON TECHNOLOGIES AG·Filed 2006·Granted Feb 10, 2009·5 cites·4 claims
- 0663US7137049B2Method and apparatus for masking known fails during memory tests readoutsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Nov 14, 2006·11 cites·13 claims
- 0763US6661718B2Testing device for testing a memoryINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 9, 2003·12 cites·20 claims
- 0863US6657452B2Configuration for measurement of internal voltages of an integrated semiconductor apparatusINFINEON TECHNOLOGIES AG·Filed 2000·Granted Dec 2, 2003·11 cites·10 claims
- 0959US6891431B2Integrated semiconductor circuit configurationINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 10, 2005·8 cites·21 claims
- 1057US6549028B1Configuration and process for testing a multiplicity of semiconductor chips on a wafer planeINFINEON TECHNOLOGIES AG·Filed 2000·Granted Apr 15, 2003·6 cites·5 claims
- 1156US7107501B2Test device, test system and method for testing a memory circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Sep 12, 2006·9 cites·10 claims
- 1254US7120841B2Data generator for generating test data for word-oriented semiconductor memoriesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 10, 2006·8 cites·9 claims
- 1352US6670665B2Memory module with improved electrical propertiesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 30, 2003·5 cites·10 claims
- 1449US7197678B2Test circuit and method for testing an integrated memory circuitINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 27, 2007·6 cites·12 claims
- 1540US7092303B2Dynamic memory and method for testing a dynamic memoryINFINEON TECHNOLOGIES AG·Filed 2002·Granted Aug 15, 2006·2 cites·13 claims
- 1638US6639856B2Memory chip having a test mode and method for checking memory cells of a repaired memory chipINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 28, 2003·2 cites·7 claims
- 1736US2008246505A1Semiconductor device test system and methodQIMONDA AG·Filed 2008·Application pending·0 cites
- 1828US7574643B2Test apparatus and method for testing a circuit unitINFINEON TECHNOLOGIES AG·Filed 2006·Granted Aug 11, 2009·0 cites·8 claims
- 1922US2006120199A1Electronic circuitOHLHOFF CARSTEN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →