Inventor · disambiguated record
Chin Hai Ang
Also filed as: ANG CHIN HAI
6 granted patents·61 citations·filing 2008–2019
80Inventor score
Top patents by PatentIndex Score
6 records- 0192US7949916B1Scan chain circuitry for delay fault testing of logic circuitsALTERA CORP·Filed 2009·Granted May 24, 2011·37 cites·16 claims
- 0284US9098486B1Methods and apparatus for testing multiple clock domain memoriesALTERA CORP·Filed 2013·Granted Aug 4, 2015·11 cites·18 claims
- 0377US7761754B1Techniques for testing memory circuitsALTERA CORP·Filed 2008·Granted Jul 20, 2010·11 cites·22 claims
- 0463US10355909B1Configuration of a programmable deviceINTEL CORP·Filed 2017·Granted Jul 16, 2019·1 cites·20 claims
- 0551US10938620B2Configuration of a programmable deviceINTEL CORP·Filed 2019·Granted Mar 2, 2021·0 cites·20 claims
- 0650US7984344B1Techniques for testing memory circuitsALTERA CORP·Filed 2010·Granted Jul 19, 2011·1 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →