Inventor · disambiguated record
Chris Atkinson
Also filed as: ATKINSON CHRIS · ATKINSON CHRIS D · ATKINSON CHRIS DALE
7 granted patents·1 pending application·50 citations·filing 2001–2016
83Inventor score
Top patents by PatentIndex Score
8 records- 0185US7596456B2Method and apparatus for cassette integrity testing using a wafer sorterTEXAS INSTRUMENTS INC·Filed 2005·Granted Sep 29, 2009·16 cites·23 claims
- 0267US9960541B2Subsea connectorSIEMENS AG·Filed 2016·Granted May 1, 2018·4 cites·20 claims
- 0357US8273523B2By-die-exposure for patterning of holes in edge dieDETWEILER SHANGTING·Filed 2006·Granted Sep 25, 2012·3 cites·18 claims
- 0457US6645684B2Error reduction in semiconductor processesTEXAS INSTRUMENTS INC·Filed 2001·Granted Nov 11, 2003·4 cites·15 claims
- 0554US7535417B2Enhancing time keeping accuracy for low power GPS receiversNOKIA CORP·Filed 2004·Granted May 19, 2009·18 cites·29 claims
- 0654US6848066B2Error reduction in semiconductor processesTEXAS INSTRUMENTS INC·Filed 2003·Granted Jan 25, 2005·3 cites·5 claims
- 0746US7374866B2System and method for exposure of partial edge dieTEXAS INSTRUMENTS INC·Filed 2004·Granted May 20, 2008·2 cites·12 claims
- 0845US2008056557A1System and method for analyzing a light beam of a wafer inspection tool or an exposure toolTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →