Inventor · disambiguated record
Christian Bernatek
Also filed as: BERNATEK CHRISTIAN
2 granted patents·4 citations·filing 1998–2001
45Inventor score
Technology areasG01N
Files withATLAS MAT TESTING TECH GMBH2
Top patents by PatentIndex Score
2 records- 0150US7308127B2Method for determining and evaluating defects in a sample surfaceATLAS MAT TESTING TECH GMBH·Filed 2001·Granted Dec 11, 2007·1 cites·9 claims
- 0228US6466313B1Method and apparatus for determining the time curve of the intensity of radiation in a weathering testing deviceATLAS MAT TESTING TECH GMBH·Filed 1998·Granted Oct 15, 2002·3 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →