Inventor · disambiguated record
Charles E. Bryson, Iii
Also filed as: BRYSON CHARLES · BRYSON CHARLES E · BRYSON CHARLES E III · BRYSON III CHARLES E
16 granted patents·2 pending applications·402 citations·filing 1978–2006
94Inventor score
Files withHEWLETT PACKARD CO3BRYSON III CHARLES E2KEVEX CORP2LUCENT TECHNOLOGIES INC2SURFACE INTERFACE INC2
Top patents by PatentIndex Score
18 records- 0193US6803570B1Electron transmissive window usable with high pressure electron spectrometryBRYSON III CHARLES E·Filed 2003·Granted Oct 12, 2004·69 cites·20 claims
- 0289US4680467AElectron spectroscopy system for chemical analysis of electrically isolated specimensKEVEX CORP·Filed 1986·Granted Jul 14, 1987·45 cites·12 claims
- 0383US6399944B1Measurement of film thickness by inelastic electron scatteringFEI CO·Filed 1999·Granted Jun 4, 2002·77 cites·20 claims
- 0481US7928381B1Coaxial charged particle energy analyzerAPPARATI INC·Filed 2006·Granted Apr 19, 2011·10 cites·34 claims
- 0581US5491738AX-ray diffraction apparatusUS ARMY·Filed 1993·Granted Feb 13, 1996·64 cites·6 claims
- 0676US4764673AElectric electron energy analyzerKEVEX CORP·Filed 1987·Granted Aug 16, 1988·21 cites·14 claims
- 0756US4192996AMeasurement of oxygen by differential absorption of UV radiationHEWLETT PACKARD CO·Filed 1978·Granted Mar 11, 1980·14 cites·23 claims
- 0854US6246060B1Apparatus for holding and aligning a scanning electron microscope sampleAGERE SYST GUARDIAN CORP·Filed 1998·Granted Jun 12, 2001·13 cites·12 claims
- 0952US5756887AMechanism for changing a probe balance beam in a scanning probe microscopeLUCENT TECHNOLOGIES INC·Filed 1997·Granted May 26, 1998·18 cites·6 claims
- 1051US5105932ALinear and rotary positioning deviceBRYSON III CHARLES E·Filed 1990·Granted Apr 21, 1992·25 cites·1 claims
- 1150US4227079AMultipath fine positioning beam directorHEWLETT PACKARD CO·Filed 1978·Granted Oct 7, 1980·10 cites·6 claims
- 1247US6178653B1Probe tip locatorLUCENT TECHNOLOGIES INC·Filed 1998·Granted Jan 30, 2001·13 cites·32 claims
- 1344US6244103B1Interpolated height determination in an atomic force microscopeSURFACE INTERFACE INC·Filed 1999·Granted Jun 12, 2001·13 cites·12 claims
- 1442US7141800B2Non-dispersive charged particle energy analyzerKELLY MICHAEL A·Filed 2004·Granted Nov 28, 2006·0 cites·23 claims
- 1541US5466933ADual electron analyzerSURFACE INTERFACE INC·Filed 1994·Granted Nov 14, 1995·6 cites·13 claims
- 1638US2005194534A1Method of operating a probe microscopeFiled 2005·Application pending·0 cites
- 1734US2003197123A1Micromachined microprobeFiled 2003·Application pending·0 cites
- 1832US4480913AFine positioning beam director systemHEWLETT PACKARD CO·Filed 1982·Granted Nov 6, 1984·4 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →