Inventor · disambiguated record
Cheng-Hsun Chan
Also filed as: CHAN CHENG H · CHAN CHENG-HSUN
5 granted patents·6 pending applications·32 citations·filing 2001–2021
74Inventor score
Files withTAIWAN SEMICONDUCTOR MFG5NOVATEK MICROELECTRONICS CORP3CHAN CHENG HSUN1LIN JIN-HO1UWIZ TECHNOLOGY CO LTD1
Top patents by PatentIndex Score
11 records- 0190US7335088B1CMP system with temperature-controlled polishing headTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Feb 26, 2008·23 cites·16 claims
- 0273US7416648B2Image sensor system for monitoring condition of electrode for electrochemical process toolsTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Aug 26, 2008·4 cites·20 claims
- 0366US7746131B2Reset signal filterNOVATEK MICROELECTRONICS CORP·Filed 2008·Granted Jun 29, 2010·5 cites·16 claims
- 0449US2022004734A1Fingerprint recognition apparatusNOVATEK MICROELECTRONICS CORP·Filed 2021·Application pending·0 cites
- 0545US2021110131A1Fingerprint recognition apparatusNOVATEK MICROELECTRONICS CORP·Filed 2020·Application pending·0 cites
- 0644US7966968B2Electroless plating apparatus with non-liquid heating sourceTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Jun 28, 2011·0 cites·19 claims
- 0744US2009174438A1Data Trigger Reset Device and Related MethodLIN JIN-HO·Filed 2008·Application pending·0 cites
- 0841US2007032180A1Slurry residence time enhancement systemTAIWAN SEMICONDUCTOR MFG·Filed 2005·Application pending·0 cites
- 0939US2011160112A1Cleaning compositionUWIZ TECHNOLOGY CO LTD·Filed 2010·Application pending·0 cites
- 1038US9659796B2Rinsing wafers using composition-tunable rinse water in chemical mechanical polishCHAN CHENG HSUN·Filed 2008·Granted May 23, 2017·0 cites·19 claims
- 1133US2003031535A1Wafer positioning check in vertical semiconductor furnacesTAIWAN SEMICONDUCTOR MFG·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →