Inventor · disambiguated record
Chan-Ming Chang
Also filed as: CHANG CHAN-MING
3 granted patents·1 pending application·0 citations·filing 2018–2025
51Inventor score
Technology areasG06N
Files withTAIWAN SEMICONDUCTOR MFG CO LTD4
Top patents by PatentIndex Score
4 records- 0183US2025315942A1Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0279US12387318B2Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Aug 12, 2025·0 cites·20 claims
- 0367US11900586B2Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 13, 2024·0 cites·20 claims
- 0454US10872406B2Hot spot defect detecting method and hot spot defect detecting systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 22, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →