Inventor · disambiguated record
Chih-Kun Chen
Also filed as: CHEN CHIH-KUN
19 granted patents·9 pending applications·126 citations·filing 2001–2020
93Inventor score
Top patents by PatentIndex Score
28 records- 0194US11309646B2Electrical connector having terminals with reduced heightLOTES CO LTD·Filed 2020·Granted Apr 19, 2022·6 cites·15 claims
- 0289US10998662B2Electrical connectorLOTES CO LTD·Filed 2020·Granted May 4, 2021·3 cites·17 claims
- 0379US6726554B1Guide ring removal deviceNANYA TECHNOLOGY CORP·Filed 2003·Granted Apr 27, 2004·27 cites·6 claims
- 0478US11469533B2Electrical terminal and electrical connector in vertical compression contact with chip moduleLOTES CO LTD·Filed 2020·Granted Oct 11, 2022·1 cites·10 claims
- 0577US6932094B2Slurry tank autocleanerNANYA TECHNOLOGY CORP·Filed 2002·Granted Aug 23, 2005·17 cites·12 claims
- 0671US6834547B2Humidity sensor and fabrication method thereofNANYA TECHNOLOGY CORP·Filed 2003·Granted Dec 28, 2004·11 cites·11 claims
- 0767US8692570B2Probe card for testing high-frequency signalsLOU CHOON LEONG·Filed 2011·Granted Apr 8, 2014·2 cites·9 claims
- 0867US6671576B1Wafer carrierNANYA TECHNOLOGY CORP·Filed 2003·Granted Dec 30, 2003·13 cites·8 claims
- 0966US6923709B2Chemical mechanical polishing apparatus having a measuring device for measuring a guide ringNANYA TECHNOLOGY CORP·Filed 2003·Granted Aug 2, 2005·12 cites·24 claims
- 1065US6790010B2Switching system for a reciprocating piston pumpNANYA TECHNOLOGY CORP·Filed 2002·Granted Sep 14, 2004·10 cites·20 claims
- 1158US6941811B2Method and apparatus for detecting wafer flawNANYA TECHNOLOGY CORP·Filed 2003·Granted Sep 13, 2005·5 cites·19 claims
- 1257US7252099B2Wafer cleaning apparatus with multiple wash-headsNANYA TECHNOLOGY CORP·Filed 2003·Granted Aug 7, 2007·8 cites·16 claims
- 1354US7091868B2Portable liquid level detectorNANYA TECHNOLOGY CORP·Filed 2003·Granted Aug 15, 2006·7 cites·12 claims
- 1453US11146007B2Electrical connector and method for manufacturing the sameLOTES CO LTD·Filed 2020·Granted Oct 12, 2021·0 cites·20 claims
- 1549US11303072B2Electrical connector and electrical connector assemblyLOTES CO LTD·Filed 2020·Granted Apr 12, 2022·0 cites·20 claims
- 1646US2021344142A1Plug connector and connector assembly having the sameLOTES CO LTD·Filed 2020·Application pending·0 cites
- 1744US2005046831A1Method and apparatus for real-time detection of wafer defectsNANYA TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 1843US6745631B2Method of measuring pore depth on the surface of a polishing padNANYA TECHNOLOGY CORP·Filed 2003·Granted Jun 8, 2004·0 cites·6 claims
- 1941US6920796B2Device used for detecting clamping force of processed object and method thereofNANYA TECHNOLOGY CORP·Filed 2003·Granted Jul 26, 2005·1 cites·32 claims
- 2039US2016058256A1Intelligent cleaning robotLOTES CO LTD·Filed 2015·Application pending·0 cites
- 2139US2004000789A1Piping apparatusNANYA TECHNOLOGY CORP·Filed 2002·Application pending·0 cites
- 2237US6743081B2In-line oscillating deviceNANYA TECHNOLOGY CORP·Filed 2001·Granted Jun 1, 2004·3 cites·16 claims
- 2336US2012043987A1Probe Card for Testing Semiconductor Devices and Vertical Probe ThereofLOU CHOON LEONG·Filed 2010·Application pending·0 cites
- 2434US2003121325A1Portable liquid level detectorNANYA TECHNOLOGY CORP·Filed 2002·Application pending·0 cites
- 2533US2004068818A1Cleaning apparatus and rollerNANYA TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 2632US2003205905A1Wafer holderNANYA TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 2732US2004038631A1Polishing pad showing intrinsic abrasion and fabrication method thereofNANYA TECHNOLOGY CORP·Filed 2003·Application pending·0 cites
- 2831US6719617B2Slurry homogenizer and supply systemNANYA TECHNOLOGY CORP·Filed 2003·Granted Apr 13, 2004·0 cites·19 claims
Join the waitlist — get patent alerts
Get an alert when Chih-Kun Chen files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →