Inventor · disambiguated record
Cheng-Hao Chen
Also filed as: CHEN CHENG · CHEN CHENG-HAO
12 granted patents·12 pending applications·19 citations·filing 1993–2023
85Inventor score
Files withINOTERA MEMORIES INC6ALIBABA GROUP HOLDING LTD2CHEN CHENG-HAO2CHU YIJ-CHIEH2FRONIEWSKI JOZEF2
Top patents by PatentIndex Score
24 records- 0172US10108243B1Smart USB plug detectionSILEGO TECH INC·Filed 2013·Granted Oct 23, 2018·5 cites·34 claims
- 0267US9178512B2Capacitive coupling based sensorFRONIEWSKI JOZEF·Filed 2011·Granted Nov 3, 2015·3 cites·20 claims
- 0366US8395370B2Capacitive coupling based sensorFRONIEWSKI JOZEF·Filed 2011·Granted Mar 12, 2013·3 cites·37 claims
- 0459US9681297B2Information exchange method and apparatusALIBABA GROUP HOLDING LTD·Filed 2015·Granted Jun 13, 2017·1 cites·20 claims
- 0558US2025133800A1Semiconductor device and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0658US2025118656A1Semiconductor device and method of manufacturing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0750US8244500B2Method of adjusting wafer processing sequenceTIAN YUN-ZONG·Filed 2009·Granted Aug 14, 2012·2 cites·12 claims
- 0849US2010223027A1Monitoring method for multi toolsINOTERA MEMORIES INC·Filed 2009·Application pending·0 cites
- 0946US12146970B2Positioning method, device, and electronic apparatusALIBABA GROUP HOLDING LTD·Filed 2021·Granted Nov 19, 2024·0 cites·20 claims
- 1046US2010004882A1Fault detection and classification method for wafer acceptance test parametersINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 1145US11474691B2Method for displaying a virtual keyboard on a mobile terminal screenORANGE·Filed 2018·Granted Oct 18, 2022·0 cites·8 claims
- 1245US10419822B2Method, device, and system for switching at a mobile terminal of a smart television and acquiring information at a television terminalCHEN CHENG·Filed 2015·Granted Sep 17, 2019·0 cites·22 claims
- 1345US2010093114A1Method of searching for key semiconductor operation with randomization for wafer positionINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 1445US2010049355A1Method for determining tool's production qualityINOTERA MEMORIES INC·Filed 2008·Application pending·0 cites
- 1544US8265903B2Method for assessing data worth for analyzing yield rateCHU YIJ CHIEH·Filed 2009·Granted Sep 11, 2012·0 cites·7 claims
- 1641US2022283698A1Method for operating an electronic device in order to browse through photosORANGE·Filed 2020·Application pending·0 cites
- 1741US2013231851A1Electronic device and method for providing traffic information to mobile devicesFIH HONG KONG LTD·Filed 2013·Application pending·0 cites
- 1839US2013170736A1Disparity estimation depth generation methodGUO JIUN-IN·Filed 2012·Application pending·0 cites
- 1938US7949509B2Method and tool for generating simulation case for IC deviceVIA TECH INC·Filed 2007·Granted May 24, 2011·0 cites·15 claims
- 2037US2011093226A1Fault detection and classification method for wafer acceptance test parametersINOTERA MEMORIES INC·Filed 2010·Application pending·0 cites
- 2136US2011153660A1Method of searching for key semiconductor operation with randomization for wafer positionINOTERA MEMORIES INC·Filed 2011·Application pending·0 cites
- 2235US2011137595A1Yield loss prediction method and associated computer readable mediumCHU YIJ-CHIEH·Filed 2010·Application pending·0 cites
- 2331US8332416B2Specification establishing method for controlling semiconductor processCHEN CHENG-HAO·Filed 2011·Granted Dec 11, 2012·0 cites·15 claims
- 2428US5284316AHydraulic magnetic control valveCHEN CHENG HAO·Filed 1993·Granted Feb 8, 1994·5 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →