Inventor · disambiguated record
Ching-Too Chen
Also filed as: CHEN CHING-TOO
8 granted patents·3 pending applications·11 citations·filing 2005–2007
78Inventor score
Top patents by PatentIndex Score
11 records- 0167US7535214B2Apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted May 19, 2009·3 cites·22 claims
- 0252US7518357B2Test circuits of an apparatus for testing micro SD devicesCHROMA ATE INC·Filed 2007·Granted Apr 14, 2009·2 cites·22 claims
- 0352US7518356B2Apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Apr 14, 2009·2 cites·14 claims
- 0447US7545158B2Method for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Jun 9, 2009·2 cites·20 claims
- 0546US7489156B2Method for testing micro SD devices using test circuitsCHRUMA ATE INC·Filed 2007·Granted Feb 10, 2009·2 cites·20 claims
- 0639US2006066846A1Apparatus and method for detection of contaminant particles or component defectsTELCO TESTING SYSTEMS LLC·Filed 2005·Application pending·0 cites
- 0738US7514914B2Test circuits of an apparatus for testing system-in-package devicesCHROMA ATE INC·Filed 2007·Granted Apr 7, 2009·0 cites·22 claims
- 0837US7489155B2Method for testing plurality of system-in-package devices using plurality of test circuitsCHROMA ATE INC·Filed 2007·Granted Feb 10, 2009·0 cites·20 claims
- 0937US7443190B1Method for testing micro SD devices using each test circuitsCHROMA ATE INC·Filed 2007·Granted Oct 28, 2008·0 cites·20 claims
- 1035US2008252321A1Apparatus for testing micro SD devicesSEMICONDUCTOR TESTING ADVANCED·Filed 2007·Application pending·0 cites
- 1135US2008252317A1Apparatus for testing system-in-package devicesSEMICONDUCTOR TESTING ADVANCED·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →