Inventor · disambiguated record
Chu Fu Chen
Also filed as: CHEN CHU FU
27 granted patents·8 pending applications·34 citations·filing 2008–2025
93Inventor score
Top patents by PatentIndex Score
35 records- 0195US10050621B2Low static current semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Aug 14, 2018·12 cites·20 claims
- 0293US10284195B2Low static current semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 7, 2019·8 cites·20 claims
- 0381US10804895B2Low static current semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Oct 13, 2020·2 cites·20 claims
- 0481US10644601B2Dead-time conduction loss reduction for buck power convertersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted May 5, 2020·3 cites·20 claims
- 0581US2025364336A1Display defect monitoring structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0675US2024387300A1Manufacturing method of group iii-v semiconductor packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0770US10924107B2Low static current semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 16, 2021·0 cites·20 claims
- 0870US10535572B2Device arrangement structure assembly and test methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 14, 2020·1 cites·20 claims
- 0970US2023392885A1Heat exchange system having desired anti-scaling performance and an anti-scaling method thereofCHEN CHU FU·Filed 2023·Application pending·0 cites
- 1069US12406892B2Display defect monitoring structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Sep 2, 2025·0 cites·20 claims
- 1169US11842920B2Semiconductor structure and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 12, 2023·0 cites·20 claims
- 1266US11936299B2Transistor having asymmetric threshold voltage and buck converterTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Mar 19, 2024·0 cites·20 claims
- 1363US11522453B2Dead-time conduction loss reduction for buck power convertersTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 6, 2022·0 cites·20 claims
- 1463US2022336295A1Manufacturing method of group iii-v semiconductor packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Application pending·0 cites
- 1560US11774196B2Heat exchange system having desired anti-scaling performance and an anti-scaling method thereofCHEN CHU FU·Filed 2019·Granted Oct 3, 2023·0 cites·15 claims
- 1660US11024552B2Device arrangement structure assembly having adhesive tape layerTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 1, 2021·0 cites·20 claims
- 1760US2025370027A1Apparatus and method for stress testing transistorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1860US2024223087A1Method of making a transistor having asymmetric threshold voltage and buck converterTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1959US10134868B2MOS devices with mask layers and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 20, 2018·0 cites·19 claims
- 2059US8418098B2Advisory system for verifying sensitive circuits in chip-designHUANG CHI-HENG·Filed 2008·Granted Apr 9, 2013·4 cites·22 claims
- 2158US11075107B2Semiconductor structure and manufacturing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jul 27, 2021·0 cites·20 claims
- 2256US10784781B2Transistor having asymmetric threshold voltage, buck converter and method of forming semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 22, 2020·0 cites·20 claims
- 2356US8779796B2Method and apparatus for device parameter measurementLUO TSENG CHIN·Filed 2010·Granted Jul 15, 2014·2 cites·19 claims
- 2455US9947762B2MOS devices with mask layers and methods for forming the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Apr 17, 2018·0 cites·20 claims
- 2555US2025022932A1High electron mobility transistor with helping gateTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2653US12020993B2Test structure and testing method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Jun 25, 2024·0 cites·20 claims
- 2753US11107737B2Control wafer and method for fabricating semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Aug 31, 2021·0 cites·20 claims
- 2851US2025306080A1System for determining transistor operating characteristicsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2950US9236273B2UV protection for lightly doped regionsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jan 12, 2016·0 cites·20 claims
- 3050US9086450B2Method for measuring capacitances of capacitorsLIU MIN-TAR·Filed 2010·Granted Jul 21, 2015·2 cites·19 claims
- 3149US9159802B2MOS devices with mask layers and methods for forming the sameCHEN CHU-FU·Filed 2012·Granted Oct 13, 2015·0 cites·18 claims
- 3248US12254262B2Calibration method for emulating group III-V semiconductor device and method for manufacturing group III-V semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Mar 18, 2025·0 cites·20 claims
- 3348US10276457B2Method for measuring charge accumulation in fabrication process of semiconductor device and method for fabricating semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Apr 30, 2019·0 cites·12 claims
- 3437US10678968B2Method of verifying and analyzing energy efficiency ratio EER of a heating ventilation and air conditioning HVAC chiller unitCHEN CHU FU·Filed 2017·Granted Jun 9, 2020·0 cites·19 claims
- 3535US9658278B2Method and apparatus for high voltage device crystal defect detectionTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted May 23, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →