Inventor · disambiguated record
Chun-Hsing Chen
Also filed as: CHEN CHUN-HSING
4 granted patents·1 pending application·23 citations·filing 2008–2023
71Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD2BENQ MATERIALS CORP1CHAO CLINTON CHIH-CHIEH1TAIWAN SEMICONDUCTOR MFG1
Top patents by PatentIndex Score
5 records- 0188US7750651B2Wafer level test probe cardTAIWAN SEMICONDUCTOR MFG·Filed 2008·Granted Jul 6, 2010·18 cites·10 claims
- 0281US11604211B1Testing device and method for integrated circuit packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Mar 14, 2023·1 cites·20 claims
- 0374US8146245B2Method for assembling a wafer level test probe cardCHAO CLINTON CHIH-CHIEH·Filed 2010·Granted Apr 3, 2012·4 cites·20 claims
- 0469US11994534B2Testing device for integrated circuit packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted May 28, 2024·0 cites·20 claims
- 0550US2015175448A1System for treating wastewater containing boron and iodineBENQ MATERIALS CORP·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →