Inventor · disambiguated record
Chih-Feng Cheng
Also filed as: CHENG CHIH-FENG
28 granted patents·12 pending applications·21 citations·filing 2006–2025
92Inventor score
Files withGLOBAL UNICHIP CORP28BIZLINK INT CORP2BIZLINK INT CORPORATION2CAL COMP BIG DATA INC2ALPHA NETWORKS INC1
Top patents by PatentIndex Score
40 records- 0195US11340288B1Testing equipment, its component carrying device and testing method of the testing equipmentGLOBAL UNICHIP CORP·Filed 2021·Granted May 24, 2022·3 cites·19 claims
- 0290US11227705B2Circuit board assembly and cableBIZLINK INT CORPORATION·Filed 2020·Granted Jan 18, 2022·2 cites·7 claims
- 0388US10154612B1Electronic device having active heat dissipationGLOBAL UNICHIP CORP·Filed 2018·Granted Dec 11, 2018·6 cites·10 claims
- 0480US10631670B1Moveable hook apparatusCAL COMP BIG DATA INC·Filed 2019·Granted Apr 28, 2020·6 cites·12 claims
- 0572US10274516B2Probe card system, probe loader device and manufacturing method of the probe loader deviceGLOBAL UNICHIP CORP·Filed 2017·Granted Apr 30, 2019·1 cites·9 claims
- 0671US10566217B2Drying apparatusGLOBAL UNICHIP CORP·Filed 2018·Granted Feb 18, 2020·1 cites·10 claims
- 0770US10502775B2Testing equipment for semiconductor element and its carrying deviceGLOBAL UNICHIP CORP·Filed 2017·Granted Dec 10, 2019·1 cites·10 claims
- 0868US12140623B2Testing apparatusGLOBAL UNICHIP CORP·Filed 2023·Granted Nov 12, 2024·0 cites·20 claims
- 0966US2025370035A1Heterogeneous thermal interface material element and pressing test device having the sameGLOBAL UNICHIP CORP·Filed 2025·Application pending·0 cites
- 1065US11703244B2Testing apparatusGLOBAL UNICHIP CORP·Filed 2020·Granted Jul 18, 2023·0 cites·17 claims
- 1165US11624759B1Inspecting device and its testing socketGLOBAL UNICHIP CORP·Filed 2022·Granted Apr 11, 2023·0 cites·20 claims
- 1264US10978770B2Flexible flat cable comprising conductor layers disposed on opposite sides of a metal isolation layerBIZLINK INT CORP·Filed 2019·Granted Apr 13, 2021·0 cites·10 claims
- 1362US2025277810A1Testing apparatus and its conductive terminalGLOBAL UNICHIP CORP·Filed 2024·Application pending·0 cites
- 1461US2025277812A1Testing apparatus of packaged modules and its manufacturing methodGLOBAL UNICHIP CORP·Filed 2024·Application pending·0 cites
- 1560US11852470B2Inspecting deviceGLOBAL UNICHIP CORP·Filed 2020·Granted Dec 26, 2023·0 cites·20 claims
- 1660US2025026029A1Element pickup mechanismGLOBAL UNICHIP CORP·Filed 2023·Application pending·0 cites
- 1757US8487642B2Burn-in socket and testing fixture using the sameSun yu-min·Filed 2010·Granted Jul 16, 2013·1 cites·8 claims
- 1854US12484149B2Electric device, its circuit board and method of manufacturing the electric deviceGLOBAL UNICHIP CORP·Filed 2022·Granted Nov 25, 2025·0 cites·8 claims
- 1954US11740260B2Pogo pin-free testing device for IC chip test and testing method of IC chipGLOBAL UNICHIP CORP·Filed 2022·Granted Aug 29, 2023·0 cites·11 claims
- 2054US11156639B2Probe card moduleGLOBAL UNICHIP CORP·Filed 2020·Granted Oct 26, 2021·0 cites·10 claims
- 2153US10598724B2Testing system for semiconductor package components and its thermal barrier layer elementGLOBAL UNICHIP CORP·Filed 2017·Granted Mar 24, 2020·0 cites·15 claims
- 2253US10041817B2Damping component and integrated-circuit testing apparatus using the sameGLOBAL UNICHIP CORP·Filed 2017·Granted Aug 7, 2018·0 cites·9 claims
- 2353US2010295989A1Image capturing device and manufacturing method of sealing structureCOMPAL ELECTRONICS INC·Filed 2009·Application pending·0 cites
- 2452US12243703B2Probe card device and circuit protection assembly thereofGLOBAL UNICHIP CORP·Filed 2022·Granted Mar 4, 2025·0 cites·18 claims
- 2552US11848250B2Thermal peak suppression deviceGLOBAL UNICHIP CORP·Filed 2021·Granted Dec 19, 2023·0 cites·11 claims
- 2652US9678110B2Probe cardGLOBAL UNICHIP CORP·Filed 2015·Granted Jun 13, 2017·0 cites·10 claims
- 2752US2025293772A1Method for establishing a connection with an optical line terminationALPHA NETWORKS INC·Filed 2024·Application pending·0 cites
- 2851US10132835B2Testing apparatus and its probe connectorGLOBAL UNICHIP CORP·Filed 2016·Granted Nov 20, 2018·0 cites·16 claims
- 2951US2023333141A1Conductive probe, method of manufacturing the same, and probe card device having the sameGLOBAL UNICHIP CORP·Filed 2022·Application pending·0 cites
- 3049US11289840B2Cable end connectorBIZLINK INT CORPORATION·Filed 2020·Granted Mar 29, 2022·0 cites·8 claims
- 3149US2020161024A1Flexible flat cable structureBIZLINK INT CORP·Filed 2019·Application pending·0 cites
- 3247US10048290B2Probe card deviceGLOBAL UNICHIP CORP·Filed 2016·Granted Aug 14, 2018·0 cites·15 claims
- 3347US2022291256A1Testing apparatus and its element pickup moduleGLOBAL UNICHIP CORP·Filed 2021·Application pending·0 cites
- 3446US11699457B2Testing system, crack noise monitoring device and method for monitoring crack noiseGLOBAL UNICHIP CORP·Filed 2021·Granted Jul 11, 2023·0 cites·18 claims
- 3542US8537150B2Method and control board for eliminating power-off residual images in display and display using the sameCHENG CHIH-FENG·Filed 2009·Granted Sep 17, 2013·0 cites·21 claims
- 3640US2020370956A1Color sensing moduleCAL COMP BIG DATA INC·Filed 2019·Application pending·0 cites
- 3739US7630187B2High-voltage pulse protection device and video apparatus deployment thereofAVERMEDIA TECH INC·Filed 2006·Granted Dec 8, 2009·0 cites·34 claims
- 3835US2017045554A1Circuit probing system and its circuit probing deviceGLOBAL UNICHIP CORP·Filed 2015·Application pending·0 cites
- 3935US2017052218A1Testing unit and testing apparatus using the sameGLOBAL UNICHIP CORP·Filed 2016·Application pending·0 cites
- 4030US7660538B2Optical burst mode receiverIND TECH RES INST·Filed 2006·Granted Feb 9, 2010·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →